Functional test generation using micro operation fault model

• Main Author: Ong, Hui Yien
• Format: Thesis
• Language: English
• Published: 2011
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/33347/1/OngHuiYienMFKE2011.pdf; http://eprints.utm.my/id/eprint/33347/; http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:69846?queryType=vitalDismax&query=Functional+test+generation+using+micro+operation+fault+model&public=true

As semiconductor technology advances further into nanometer regime, integrated circuit testing and validation continues to play a very important role to ensure high quality product. Conventionally, test patterns are generated from a gate level netlist using test generation tool. However, as the digi...