Universal velocity-field characteristics for a nanowire arbitrary degeneracy

• Main Authors: Tan, Michael Loong Peng, Hashim, Abdul Manaf, Arora, Vijay Kumar, Desmond, C. Y. Chek
• Format: Book Section
• Published: American Institute of Physics 2011
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/30201/; http://dx.doi.org/10.1063/1.3586975

The effects of electric field on the carrier motion and drift velocity in nanowire (NW) are presented in this paper. When the electric field is applied in NW, the electron is expected to move in anti-parallel direction to the electric field. This is so-called randomness motion is transformed into st...