Resistance blow-up effect in micro-circuit engineering
The nonlinearity in the I–V characteristics of a scaled-down micro/nano-scale resistive channel is shown to elevate the DC and signal resistance as current approaches its saturation value. The deviation from traditional circuitengineering takes place when the applied voltage is increased beyond the...
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| Main Authors: | , , |
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| Format: | Article |
| Published: |
Elsevier B.V.
2010
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/26549/ http://dx.doi.org/10.1016/j.sse.2010.06.024 |
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