A study on signature analyzer for design for test (DFT)

• Main Authors: A'ain, Abu Khari, Lim, C. T., Kok, Hong Ng, Sheng, Kwang Ng, Liew, Eng Yew
• Format: Book Section
• Language: English
• Published: IEEE 2004
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/1888/1/AbuLimKok2004_StudyOnSignatureAnalyzerForDFT.pdf; http://eprints.utm.my/id/eprint/1888/

This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences...