An improved features selection approach for control chart patterns recognition.

• Main Authors: Alwan, Waseem, Ngadiman, Nor Hasrul Akhmal, Hassan, Adnan, Mohd. Saufi, Mohd. Syahril Ramadhan, Ma'aram, Azanizawati, Masood, Ibrahim
• Format: Article
• Language: English
• Published: Institute of Advanced Engineering and Science 2023
• Subjects: TJ Mechanical engineering and machinery
• Online Access: http://eprints.utm.my/104978/1/NorHasrulAkhmalNgadiman2023_AnImprovedFeaturesSelectionApproachforControl.pdf; http://eprints.utm.my/104978/; http://dx.doi.org/10.11591/ijeecs.v31.i2.pp734-746

Control chart patterns (CCPs) are an essential diagnostic tool for process monitoring using statistical process control (SPC). CCPs are widely used to improve production quality in many engineering applications. The principle is to recognize the state of a process, either a stable process or a deter...