Control chart pattern recognition using small window size for identifying bivariate process mean shifts

• Main Authors: Kasmin, A., Masood, I., Abdul Rahman, N., Abdul Kadir, A. H., Abdol Rahman, M. N.
• Format: Article
• Language: English
• Published: Penerbit UTHM 2021
• Subjects: TS155-194 Production management. Operations management
• Online Access: http://eprints.uthm.edu.my/3753/1/J12571_dbdbdc6b98c363f5fad729580c5fe8b7.pdf; http://eprints.uthm.edu.my/3753/; https://doi.org/10.30880/ijie.2021.13.02.024

There are many traits in the manufacturing technology to assure the quality of products. One of the current practices aims for monitoring the in-process quality of small-lot production using Statistical Process Control (SPC), which requires small samples or small window sizes. In this study, the rec...