Optical and Mott-Schottky Studies of Ternary MoSSe Thin Films Synthesized by Electrochemical Route

The objectives of this paper is to synthesise the ternary molybdenum sulphoselenide MoSSe thin films via electrodeposition technique and analyse the effect of film thickness to its optical and semiconducting properties. Transition metal molybdenum sulphoselenide, MoSSe thin films have been electro...

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Main Authors: T., Joseph Sahaya Anand, S., Shariza, Z.M., Rosli, Azizah, Shaaban, Sivarao, Subramonian, Mohamad, Radzai Said, S., Thiru
Format: Article
Language:English
Published: IDOSI Publications 2013
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Online Access:http://eprints.utem.edu.my/id/eprint/8591/1/26_WASJ_21.pdf
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spelling my.utem.eprints.85912015-05-28T03:57:46Z http://eprints.utem.edu.my/id/eprint/8591/ Optical and Mott-Schottky Studies of Ternary MoSSe Thin Films Synthesized by Electrochemical Route T., Joseph Sahaya Anand S., Shariza Z.M., Rosli Azizah, Shaaban Sivarao, Subramonian Mohamad, Radzai Said S., Thiru TJ Mechanical engineering and machinery The objectives of this paper is to synthesise the ternary molybdenum sulphoselenide MoSSe thin films via electrodeposition technique and analyse the effect of film thickness to its optical and semiconducting properties. Transition metal molybdenum sulphoselenide, MoSSe thin films have been electrosynthesized on indium-tin-oxide (ITO)-coated glass and stainless steel substrates. The thin films were characterized for their structural, surface morphological, compositional characteristics as well as optical properties and semiconducting parameters. Structural analysis via X-ray diffraction (XRD) reveals that the films are polycrystalline in nature. Scanning electron microscope (SEM) studies reveal the morphology of the film with crystallites on the surface. Compositional analysis via energy dispersive X-ray (EDX) analysis confirms the presence of Mo, S and Se elements in the films. The optical studies show that the films are of direct bandgap. Results on the semiconductor parameters analysis of the films showed that the nature of the Mott-Schottky plots indicates that the films obtained are of n-type material. For all films, the semiconductor parameter values come in the potential range of leading chalcogenides as a semiconductor thin film which can be suitable for photo electrochemical solar cell in the near future. IDOSI Publications 2013 Article PeerReviewed application/pdf en http://eprints.utem.edu.my/id/eprint/8591/1/26_WASJ_21.pdf T., Joseph Sahaya Anand and S., Shariza and Z.M., Rosli and Azizah, Shaaban and Sivarao, Subramonian and Mohamad, Radzai Said and S., Thiru (2013) Optical and Mott-Schottky Studies of Ternary MoSSe Thin Films Synthesized by Electrochemical Route. World Applied Sciences Journal, 21. pp. 60-67. ISSN 1818-4952 http://www.wasj.org/
institution Universiti Teknikal Malaysia Melaka
building UTEM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknikal Malaysia Melaka
content_source UTEM Institutional Repository
url_provider http://eprints.utem.edu.my/
language English
topic TJ Mechanical engineering and machinery
spellingShingle TJ Mechanical engineering and machinery
T., Joseph Sahaya Anand
S., Shariza
Z.M., Rosli
Azizah, Shaaban
Sivarao, Subramonian
Mohamad, Radzai Said
S., Thiru
Optical and Mott-Schottky Studies of Ternary MoSSe Thin Films Synthesized by Electrochemical Route
description The objectives of this paper is to synthesise the ternary molybdenum sulphoselenide MoSSe thin films via electrodeposition technique and analyse the effect of film thickness to its optical and semiconducting properties. Transition metal molybdenum sulphoselenide, MoSSe thin films have been electrosynthesized on indium-tin-oxide (ITO)-coated glass and stainless steel substrates. The thin films were characterized for their structural, surface morphological, compositional characteristics as well as optical properties and semiconducting parameters. Structural analysis via X-ray diffraction (XRD) reveals that the films are polycrystalline in nature. Scanning electron microscope (SEM) studies reveal the morphology of the film with crystallites on the surface. Compositional analysis via energy dispersive X-ray (EDX) analysis confirms the presence of Mo, S and Se elements in the films. The optical studies show that the films are of direct bandgap. Results on the semiconductor parameters analysis of the films showed that the nature of the Mott-Schottky plots indicates that the films obtained are of n-type material. For all films, the semiconductor parameter values come in the potential range of leading chalcogenides as a semiconductor thin film which can be suitable for photo electrochemical solar cell in the near future.
format Article
author T., Joseph Sahaya Anand
S., Shariza
Z.M., Rosli
Azizah, Shaaban
Sivarao, Subramonian
Mohamad, Radzai Said
S., Thiru
author_facet T., Joseph Sahaya Anand
S., Shariza
Z.M., Rosli
Azizah, Shaaban
Sivarao, Subramonian
Mohamad, Radzai Said
S., Thiru
author_sort T., Joseph Sahaya Anand
title Optical and Mott-Schottky Studies of Ternary MoSSe Thin Films Synthesized by Electrochemical Route
title_short Optical and Mott-Schottky Studies of Ternary MoSSe Thin Films Synthesized by Electrochemical Route
title_full Optical and Mott-Schottky Studies of Ternary MoSSe Thin Films Synthesized by Electrochemical Route
title_fullStr Optical and Mott-Schottky Studies of Ternary MoSSe Thin Films Synthesized by Electrochemical Route
title_full_unstemmed Optical and Mott-Schottky Studies of Ternary MoSSe Thin Films Synthesized by Electrochemical Route
title_sort optical and mott-schottky studies of ternary mosse thin films synthesized by electrochemical route
publisher IDOSI Publications
publishDate 2013
url http://eprints.utem.edu.my/id/eprint/8591/1/26_WASJ_21.pdf
http://eprints.utem.edu.my/id/eprint/8591/
http://www.wasj.org/
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score 13.214268