A development of Time Domain Reflectometry (TDR) methodology to detect wire sweep defect in nearly short condition

• Main Author: Ng, Kiong Kay
• Format: Thesis
• Language: English; English
• Published: 2023
• Subjects: T Technology (General); TA Engineering (General). Civil engineering (General)
• Online Access: http://eprints.utem.edu.my/id/eprint/28301/1/A%20development%20of%20Time%20Domain%20Reflectometry%20%28TDR%29%20methodology%20to%20detect%20wire%20sweep%20defect%20in%20nearly%20short%20condition.pdf; http://eprints.utem.edu.my/id/eprint/28301/2/A%20development%20of%20Time%20Domain%20Reflectometry%20%28TDR%29%20methodology%20to%20detect%20wire%20sweep%20defect%20in%20nearly%20short%20condition.pdf; http://eprints.utem.edu.my/id/eprint/28301/; https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=123813

Wire sweep is a common defect observed in power semiconductor devices, especially when bonded with thin aluminium wire (< 100μm). The conventional methods for detecting the wire sweep defect are Automatic Optical Inspection (AOI), Real-Time X-ray and Automatic Test Equipment (ATE). However, all t...