X-ray diffraction and photoelectron spectroscopy analyses of MXene electrode material used in energy storage applications - a review
X-rays have many uses in screening and materials characterization applications. X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) analysis are among them. From the XRD data, a crystal structure can be determined by analysis of the XRD pattern, intensity, and positions of the peaks....
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Main Authors: | , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Walter de Gruyter GmbH
2024
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Online Access: | http://eprints.utem.edu.my/id/eprint/27818/2/0121721082024112461028.pdf http://eprints.utem.edu.my/id/eprint/27818/ https://www.degruyter.com/document/doi/10.1515/mt-2023-0295/html?lang=en |
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