NANOSTRUCTURAL STUDIES OF SPUTTER-DEPOSITED NixAl1-x (0.5 ≤ x ≤ 1.0) ALLOY THIN FILMS

The nanostructural characteristics of direct-current magnetron sputter-deposited NixAl1-x (0.5 ≤ x ≤ 1.0) alloy films were studied during in situ isothermal annealing in a transmission electron microscope. An expansion of the lattice by nearly 5% was observed for the Ni0.5Al0.5 and the Ni0.8Al0.2 fi...

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Bibliographic Details
Main Authors: T., Joseph Sahaya Anand, A., H.W. Ngan
Format: Article
Language:English
Published: Universiti Putra Malaysia 2011
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Online Access:http://eprints.utem.edu.my/id/eprint/10139/1/MJM_7.pdf
http://eprints.utem.edu.my/id/eprint/10139/
http://www.myjurnal.my/public/browse-journal-view.php?id=103
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