Cover Image

On-wafer noise figure characterization for radio frequency integrated circuits.

Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figu...

Full description

Saved in:
Bibliographic Details
Main Author: Mohd, Shukri Korakkottil Kunhi
Format: Thesis
Language:English
Published: 2011
Subjects:
TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf
http://eprints.usm.my/41103/
Tags: Add Tag
No Tags, Be the first to tag this record!
id my.usm.eprints.41103
record_format eprints
spelling my.usm.eprints.41103 http://eprints.usm.my/41103/ On-wafer noise figure characterization for radio frequency integrated circuits. Mohd, Shukri Korakkottil Kunhi TK1-9971 Electrical engineering. Electronics. Nuclear engineering Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF. 2011-03 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf Mohd, Shukri Korakkottil Kunhi (2011) On-wafer noise figure characterization for radio frequency integrated circuits. Masters thesis, Universiti Sains Malaysia.
institution Universiti Sains Malaysia
building Hamzah Sendut Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Sains Malaysia
content_source USM Institutional Repository
url_provider http://eprints.usm.my/
language English
topic TK1-9971 Electrical engineering. Electronics. Nuclear engineering
spellingShingle TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Mohd, Shukri Korakkottil Kunhi
On-wafer noise figure characterization for radio frequency integrated circuits.
description Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF.
format Thesis
author Mohd, Shukri Korakkottil Kunhi
author_facet Mohd, Shukri Korakkottil Kunhi
author_sort Mohd, Shukri Korakkottil Kunhi
title On-wafer noise figure characterization for radio frequency integrated circuits.
title_short On-wafer noise figure characterization for radio frequency integrated circuits.
title_full On-wafer noise figure characterization for radio frequency integrated circuits.
title_fullStr On-wafer noise figure characterization for radio frequency integrated circuits.
title_full_unstemmed On-wafer noise figure characterization for radio frequency integrated circuits.
title_sort on-wafer noise figure characterization for radio frequency integrated circuits.
publishDate 2011
url http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf
http://eprints.usm.my/41103/
_version_ 1643710129558781952
score 13.18916

Similar Items