Exploring High Resolution Test Pattern To Improve The Cache Failure Analysis

• Main Author: Ong, Chein Ee
• Format: Thesis
• Language: English
• Published: 2017
• Subjects: TK1-9971 Electrical engineering. Electronics. Nuclear engineering
• Online Access: http://eprints.usm.my/39576/1/ONG_CHEIN_EE_24_Pages.pdf; http://eprints.usm.my/39576/

Typically, only pass/fail basis test algorithm is being used to test the cache array in silicon devices. But the pass/fail basis test algorithm is insufficient to identify the failing characteristic of the cache array when it comes to the failure analysis (FA) and debug stage to find out the root ca...