Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.
With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices.
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| Main Authors: | , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2014
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| Subjects: | |
| Online Access: | http://eprints.usm.my/28202/1/Fast_S-parameter_Convolution_for_Eye_Diagram_Simulations_of_High-speed_Interconnects.pdf http://eprints.usm.my/28202/ |
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