Growth and characterization of La5/8Ca3/8MnO3 films by pulsed laser deposition on silicon wafer substrate

• Main Authors: Navaseri, M., Shaari, Abdul Halim, Lim, Kean Pah, Chen, Soo Kien, Abd Shukor, Roslan
• Format: Article
• Language: English
• Published: Malaysian Solid State Science and Technology Society 2014
• Online Access: http://psasir.upm.edu.my/id/eprint/37802/1/Growth%20and%20characterization%20of%20La58Ca38MnO3.pdf; http://psasir.upm.edu.my/id/eprint/37802/; http://journal.masshp.net/vol-22-no-1-2-2014/

By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average grain size of 15nm. The LCMO films exhibited typical characteristics of CMR material with the metal-insulator transition temperature at TP=245 K. The film has a maximum %MR of about %16.52 and mean surface roughness of about 147.4 nm.