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Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans

This work describes a method to obtain surface microtopography of a material by scanning its capacitance. Capacitance was measured by the three terminal method with the core of a coaxial cable used as the measuring probe while the shielding wire acted as the guard electrode to eliminate the fringin...

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Main Authors: Wan Yusof, Wan Mohamad Daud, Talib, Zainal Abidin, Ismail, Mohd Zaid
Format: Article
Language:English
Malay
Published: Universiti Putra Malaysia Press 1999
Online Access:http://psasir.upm.edu.my/id/eprint/3490/1/Penentuan_Struktur_Permukaan_dengan_Menggunakan.pdf
http://psasir.upm.edu.my/id/eprint/3490/
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spelling my.upm.eprints.34902013-05-27T07:08:56Z http://psasir.upm.edu.my/id/eprint/3490/ Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans Wan Yusof, Wan Mohamad Daud Talib, Zainal Abidin Ismail, Mohd Zaid This work describes a method to obtain surface microtopography of a material by scanning its capacitance. Capacitance was measured by the three terminal method with the core of a coaxial cable used as the measuring probe while the shielding wire acted as the guard electrode to eliminate the fringing field effect. From our results, we found that good image resolution is best obtained if the medium used has a high dielectric constant than the sample. Universiti Putra Malaysia Press 1999 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/3490/1/Penentuan_Struktur_Permukaan_dengan_Menggunakan.pdf Wan Yusof, Wan Mohamad Daud and Talib, Zainal Abidin and Ismail, Mohd Zaid (1999) Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans. Pertanika Journal of Science & Technology, 7 (2). pp. 125-131. ISSN 0128-7680 Malay
institution Universiti Putra Malaysia
building UPM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Putra Malaysia
content_source UPM Institutional Repository
url_provider http://psasir.upm.edu.my/
language English
Malay
description This work describes a method to obtain surface microtopography of a material by scanning its capacitance. Capacitance was measured by the three terminal method with the core of a coaxial cable used as the measuring probe while the shielding wire acted as the guard electrode to eliminate the fringing field effect. From our results, we found that good image resolution is best obtained if the medium used has a high dielectric constant than the sample.
format Article
author Wan Yusof, Wan Mohamad Daud
Talib, Zainal Abidin
Ismail, Mohd Zaid
spellingShingle Wan Yusof, Wan Mohamad Daud
Talib, Zainal Abidin
Ismail, Mohd Zaid
Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans
author_facet Wan Yusof, Wan Mohamad Daud
Talib, Zainal Abidin
Ismail, Mohd Zaid
author_sort Wan Yusof, Wan Mohamad Daud
title Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans
title_short Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans
title_full Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans
title_fullStr Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans
title_full_unstemmed Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans
title_sort penentuan struktur permukaan dengan menggunakan kaedah kapasitans
publisher Universiti Putra Malaysia Press
publishDate 1999
url http://psasir.upm.edu.my/id/eprint/3490/1/Penentuan_Struktur_Permukaan_dengan_Menggunakan.pdf
http://psasir.upm.edu.my/id/eprint/3490/
_version_ 1643822626436546560
score 13.18916

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