Structural, morphology and electrical properties of layered copper selenide thin film

• Main Authors: Ying, Josephine Chyi Liew, Talib, Zainal Abidin, Mat Yunus, Wan Mahmood, Zainal, Zulkarnain, Shaari, Abdul Halim, Abd. Moksin, Mohd Maarof, Wan Yusoff, Wan Mohd Daud, Lim, Kean Pah
• Format: Article
• Language: English
• Published: Versita Warsaw and Springer 2009
• Online Access: http://psasir.upm.edu.my/id/eprint/16870/1/Structural%2C%20morphology%20and%20electrical%20properties%20of%20layered%20copper%20selenide%20thin%20film%20.pdf; http://psasir.upm.edu.my/id/eprint/16870/; http://www.degruyter.com/view/j/phys.2009.7.issue-2/s11534-009-0057-1/s11534-009-0057-1.xml

Thin films of copper selenide (CuSe) were physically deposited layer-by-layer up to 5 layers using thermal evaporation technique onto a glass substrate. Various film properties, including the thickness, structure, morphology, surface roughness, average grain size and electrical conductivity are stud...