In-situ analysis energy level alignment at solution processed HAT(CN)6/PVK (PVK:TAPC) interface via XPS and UPS
We present in-depth analysis of an n/p heterojunction that consists of 1,4,5,8,9,11-hexaazatriphenylene hexacarbonitrile (HAT(CN)6) (n-type) and Poly(9-vinylcarbazole) (PVK) (p-type) via X-ray Photoelectron Spectroscopy (XPS) and Ultra-violet Photoelectron Spectroscopy (UPS) measurement. The p-type...
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| Main Authors: | , , , |
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2018
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| Online Access: | http://dspace.uniten.edu.my/jspui/handle/123456789/8762 |
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