Space-Charge-Limited Dark Injection (SCL DI) transient measurements
It is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection...
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my.uniten.dspace-58342018-01-14T23:47:59Z Space-Charge-Limited Dark Injection (SCL DI) transient measurements Yap, B.K. Koh, S.P. Tiong, S.K. Ong, C.N. It is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection (SCL DI) Transient Measurement that allows us to confirm an ohmic injecting interface, to determine the mobility values of the bulk materials and to study the injection efficiency of the interfaces of the semiconductor materials. © 2010 IEEE. 2017-12-08T07:26:35Z 2017-12-08T07:26:35Z 2010 Conference Paper 10.1109/SMELEC.2010.5549542 en_US IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 2010, Article number 5549542, Pages 192-194 |
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It is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection (SCL DI) Transient Measurement that allows us to confirm an ohmic injecting interface, to determine the mobility values of the bulk materials and to study the injection efficiency of the interfaces of the semiconductor materials. © 2010 IEEE. |
| format |
Conference Paper |
| author |
Yap, B.K. Koh, S.P. Tiong, S.K. Ong, C.N. |
| spellingShingle |
Yap, B.K. Koh, S.P. Tiong, S.K. Ong, C.N. Space-Charge-Limited Dark Injection (SCL DI) transient measurements |
| author_facet |
Yap, B.K. Koh, S.P. Tiong, S.K. Ong, C.N. |
| author_sort |
Yap, B.K. |
| title |
Space-Charge-Limited Dark Injection (SCL DI) transient measurements |
| title_short |
Space-Charge-Limited Dark Injection (SCL DI) transient measurements |
| title_full |
Space-Charge-Limited Dark Injection (SCL DI) transient measurements |
| title_fullStr |
Space-Charge-Limited Dark Injection (SCL DI) transient measurements |
| title_full_unstemmed |
Space-Charge-Limited Dark Injection (SCL DI) transient measurements |
| title_sort |
space-charge-limited dark injection (scl di) transient measurements |
| publishDate |
2017 |
| _version_ |
1644493787372716032 |
| score |
13.214268 |