Thermal stress test for PLED

This work presents thermal stability studies of PLEDs involving the comparison of electrical performance before and after thermal treatment. Two cycles of continuous thermal stress test from room temperature to 100 deg Celsius did not significantly affect the total photoluminescence intensity from t...

Full description

Saved in:
Bibliographic Details
Main Authors: Yap, B.K., Koh, S.P., Tiong, S.K., Ong, C.N.
Format: Conference Paper
Language:en_US
Published: 2017
Tags: Add Tag
No Tags, Be the first to tag this record!
id my.uniten.dspace-5833
record_format dspace
spelling my.uniten.dspace-58332018-01-04T07:19:37Z Thermal stress test for PLED Yap, B.K. Koh, S.P. Tiong, S.K. Ong, C.N. This work presents thermal stability studies of PLEDs involving the comparison of electrical performance before and after thermal treatment. Two cycles of continuous thermal stress test from room temperature to 100 deg Celsius did not significantly affect the total photoluminescence intensity from the light-emitting polymer in the PLED suggesting that the layer of light-emitting polymer is intact. However, the rapid degradation of the electrical performance of the PLED right after the first cycle of thermal stress test suggests that the electrodes have degraded hence hindering charge injection into the polymeric layer. © 2010 IEEE. 2017-12-08T07:26:34Z 2017-12-08T07:26:34Z 2010 Conference Paper 10.1109/SMELEC.2010.5549354 en_US IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 2010, Article number 5549354, Pages 370-372
institution Universiti Tenaga Nasional
building UNITEN Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Tenaga Nasional
content_source UNITEN Institutional Repository
url_provider http://dspace.uniten.edu.my/
language en_US
description This work presents thermal stability studies of PLEDs involving the comparison of electrical performance before and after thermal treatment. Two cycles of continuous thermal stress test from room temperature to 100 deg Celsius did not significantly affect the total photoluminescence intensity from the light-emitting polymer in the PLED suggesting that the layer of light-emitting polymer is intact. However, the rapid degradation of the electrical performance of the PLED right after the first cycle of thermal stress test suggests that the electrodes have degraded hence hindering charge injection into the polymeric layer. © 2010 IEEE.
format Conference Paper
author Yap, B.K.
Koh, S.P.
Tiong, S.K.
Ong, C.N.
spellingShingle Yap, B.K.
Koh, S.P.
Tiong, S.K.
Ong, C.N.
Thermal stress test for PLED
author_facet Yap, B.K.
Koh, S.P.
Tiong, S.K.
Ong, C.N.
author_sort Yap, B.K.
title Thermal stress test for PLED
title_short Thermal stress test for PLED
title_full Thermal stress test for PLED
title_fullStr Thermal stress test for PLED
title_full_unstemmed Thermal stress test for PLED
title_sort thermal stress test for pled
publishDate 2017
_version_ 1644493787073871872
score 13.214268