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Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material

This paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer...

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Main Authors: Hock, G.C., Chakrabarty, C.K., Badjian, M.H., Devkumar, S., Emilliano
Format: Conference Paper
Language:en_US
Published: 2017
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spelling my.uniten.dspace-57432017-12-14T01:46:04Z Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material Hock, G.C. Chakrabarty, C.K. Badjian, M.H. Devkumar, S. Emilliano This paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer were obtained for phase shifting analysis. They are used as inputs to the evaluation board. The output from the evaluation board was connected to computer for data processing. The voltage values obtained from the board was then converted to phase angle by using the pre-calibrated data and LabView™ graphical programming language. © 2008 IEEE. 2017-12-08T06:45:49Z 2017-12-08T06:45:49Z 2008 Conference Paper 10.1109/RFM.2008.4897416 en_US 2008 IEEE International RF and Microwave Conference, RFM 2008 2008, Article number 4897416, Pages 167-170
institution Universiti Tenaga Nasional
building UNITEN Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Tenaga Nasional
content_source UNITEN Institutional Repository
url_provider http://dspace.uniten.edu.my/
language en_US
description This paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer were obtained for phase shifting analysis. They are used as inputs to the evaluation board. The output from the evaluation board was connected to computer for data processing. The voltage values obtained from the board was then converted to phase angle by using the pre-calibrated data and LabView™ graphical programming language. © 2008 IEEE.
format Conference Paper
author Hock, G.C.
Chakrabarty, C.K.
Badjian, M.H.
Devkumar, S.
Emilliano
spellingShingle Hock, G.C.
Chakrabarty, C.K.
Badjian, M.H.
Devkumar, S.
Emilliano
Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material
author_facet Hock, G.C.
Chakrabarty, C.K.
Badjian, M.H.
Devkumar, S.
Emilliano
author_sort Hock, G.C.
title Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material
title_short Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material
title_full Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material
title_fullStr Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material
title_full_unstemmed Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material
title_sort super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material
publishDate 2017
_version_ 1644493764473913344
score 13.214268

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