Characterization of parasitic residual deposition on passivation layer in electroless nickel immersion gold process
The problem of parasitic residual deposition on the passivation layer in electroless deposition process is studied in this paper. The characterization analysis tools involved are focused ion beam (FIB), scanning electron microscopy (SEM), electron dispersive X-ray (EDX) and metallurgical interface a...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | |
| Published: |
2017
|
| Online Access: | http://dspace.uniten.edu.my:8080/jspui/handle/123456789/5297 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|