Exploring the impact of defect energy levels in CdTe/Si dual-junction solar cells using wxAMPS

• 主要な著者: Isah M., Doroody C., Rahman K.S., Rahman M.N.A., Goje A.A., Soudagar M.E.M., Kiong T.S., Mubarak N.M., Zuhdi A.W.M.
• その他の著者: 57219626175
• フォーマット: 論文
• 出版事項: Nature Research 2025
• 主題: article; controlled study; current density; electric potential; energy; short circuit current; solar cell; thickness

A numerical analysis of a CdTe/Si dual-junction solar cell in terms of defect density introduced at various defect energy levels in the absorber layer is provided. The impact of defect concentration is analyzed against the thickness of the CdTe layer, and variation of the top and bottom cell bandgap...