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Electrical stability of PLEDs

We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4-ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes...

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Bibliographic Details
Main Authors: Kar Y.B., Bradley D.
Other Authors: 26649255900
Format: Conference paper
Published: 2023
Subjects:
Aromatic compounds
Light emission
Light emitting diodes
Nanotechnology
Organic polymers
Dark injection
Dibenzothiophenes
Electrical stability
Electrical stress testing
Ethylenedioxythiophenes
Lifetime data
Light emitting layers
PEDOT:PSS
Phenylenediamines
Polymer light-emitting diodes
Sumitomo chemicals
Time evolutions
Power quality
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Summary:We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4-ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes (PLEDs). Continuous electrical stress testing is carried out to study the time evolution of dark injection hole transients for devices with and without a poly [2,7-(9,9-di-n-octylfluorene)-alt-(1,4-phenylene-((4-secbutylphenyl)imino)-1, 4-phenylene)] (TFB) interlayer. A Sumitomo Chemical Company dibenzothiophene phenylenediamine copolymer (SC002) was used as light emitting layer and PLED characteristics with and without the interlayer are discussed together with lifetime data. �2010 IEEE.

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