Effects of oxygen concentration variation on the structural and optical properties of reactive sputtered WOx thin film
Electron transport properties; Finite difference time domain method; Infrared devices; Optoelectronic devices; Oxide films; Perovskite; Perovskite solar cells; Refractive index; Scanning electron microscopy; Spectroscopy; Surface roughness; Thin films; Transition metal oxides; Transition metals; Con...
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my.uniten.dspace-261082023-05-29T17:06:53Z Effects of oxygen concentration variation on the structural and optical properties of reactive sputtered WOx thin film Mahjabin S. Mahfuzul Haque M. Khan S. Selvanathan V. Jamal M.S. Bashar M.S. Alkhammash H.I. Ismail Hossain M. Shahiduzzaman M. Amin N. Sopian K. Akhtaruzzaman M. 57217200870 57226121522 57194049079 57160057200 55887499100 36109906900 56711980800 39561176900 55640096500 7102424614 7003375391 57195441001 Electron transport properties; Finite difference time domain method; Infrared devices; Optoelectronic devices; Oxide films; Perovskite; Perovskite solar cells; Refractive index; Scanning electron microscopy; Spectroscopy; Surface roughness; Thin films; Transition metal oxides; Transition metals; Concentration variation; Effect of oxygen; Gas flowrate; Optical parameter; Optical-; Oxygen concentrations; Property; Structural and optical properties; Thin-films; Transition-metal oxides; Oxygen; absorption; electron; film; gas flow; optical property; oxygen; perovskite; tungsten; X-ray diffraction Tungsten oxide (WOx) has been widely investigated due to mainly its optoelectronic properties. This study primarily aimed to examine the influence of oxygen concentration on the structural and optical properties of WOx films. Herein, WOx thin films have been prepared by reactive sputtering method at low power (50 W) while controlling the Ar:O2 gas flow rate to vary oxygen concentration. Energy Dispersive X-ray (EDX) analysis reveals that the oxygen concentration depends on the gas flow rate. Such oxygen concentration changes affect the film's thickness, confirmed by the field emission scanning electron microscope (FESEM). Atomic force microscopy (AFM) analysis ensures the dependency of surface roughness of the films on the oxygen concentration. The developed films exhibit the amorphous state as validated by X-ray Diffraction (XRD) analysis. The Ultraviolet�Visible (UV�Vis) spectroscopy measurement was also conducted to determine transmittance and absorbance of the film, which further allows realizing necessary optical parameters, such as absorption coefficient, skin depth, energy bandgap, refractive index, extinction coefficient, etc. The oxygen concentration-dependent optical parameters are investigated in the spectral range of UV to near-infrared regions to ensure the use of WOx for optoelectronic device applications. Finally, we considered the optimized WOx film as a potential electron transport layer (ETL) to realize an efficient perovskite solar cell. The optics and optimization of this solar cell were studied by finite-difference time-domain (FDTD) simulations. The investigation allows us to calculate the maximum quantum efficiency (QE) and short-circuit current density (JSC) of ~90% and 22.1 mA/cm2, respectively. � 2021 International Solar Energy Society Final 2023-05-29T09:06:53Z 2023-05-29T09:06:53Z 2021 Article 10.1016/j.solener.2021.05.031 2-s2.0-85110488948 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85110488948&doi=10.1016%2fj.solener.2021.05.031&partnerID=40&md5=11a4a0a3a0f5f50b64661b595091db3b https://irepository.uniten.edu.my/handle/123456789/26108 222 202 211 Elsevier Ltd Scopus |
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Electron transport properties; Finite difference time domain method; Infrared devices; Optoelectronic devices; Oxide films; Perovskite; Perovskite solar cells; Refractive index; Scanning electron microscopy; Spectroscopy; Surface roughness; Thin films; Transition metal oxides; Transition metals; Concentration variation; Effect of oxygen; Gas flowrate; Optical parameter; Optical-; Oxygen concentrations; Property; Structural and optical properties; Thin-films; Transition-metal oxides; Oxygen; absorption; electron; film; gas flow; optical property; oxygen; perovskite; tungsten; X-ray diffraction |
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57217200870 Mahjabin S. Mahfuzul Haque M. Khan S. Selvanathan V. Jamal M.S. Bashar M.S. Alkhammash H.I. Ismail Hossain M. Shahiduzzaman M. Amin N. Sopian K. Akhtaruzzaman M. |
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Mahjabin S. Mahfuzul Haque M. Khan S. Selvanathan V. Jamal M.S. Bashar M.S. Alkhammash H.I. Ismail Hossain M. Shahiduzzaman M. Amin N. Sopian K. Akhtaruzzaman M. |
spellingShingle |
Mahjabin S. Mahfuzul Haque M. Khan S. Selvanathan V. Jamal M.S. Bashar M.S. Alkhammash H.I. Ismail Hossain M. Shahiduzzaman M. Amin N. Sopian K. Akhtaruzzaman M. Effects of oxygen concentration variation on the structural and optical properties of reactive sputtered WOx thin film |
author_sort |
Mahjabin S. |
title |
Effects of oxygen concentration variation on the structural and optical properties of reactive sputtered WOx thin film |
title_short |
Effects of oxygen concentration variation on the structural and optical properties of reactive sputtered WOx thin film |
title_full |
Effects of oxygen concentration variation on the structural and optical properties of reactive sputtered WOx thin film |
title_fullStr |
Effects of oxygen concentration variation on the structural and optical properties of reactive sputtered WOx thin film |
title_full_unstemmed |
Effects of oxygen concentration variation on the structural and optical properties of reactive sputtered WOx thin film |
title_sort |
effects of oxygen concentration variation on the structural and optical properties of reactive sputtered wox thin film |
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Elsevier Ltd |
publishDate |
2023 |
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1806423400924577792 |
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13.214268 |