Optical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rate
Cadmium sulfide; Cadmium telluride; Copper compounds; Deposition rates; Energy gap; II-VI semiconductors; Lime; Magnetron sputtering; Refractive index; Substrates; Sulfur compounds; Thin film solar cells; Tin compounds; Zinc sulfide; Absorption co-efficient; Complex refractive index; Interference fr...
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2023
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my.uniten.dspace-254482023-05-29T16:09:32Z Optical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rate Ahamed E.M.K.I. Das N.K. Farhad S.F.U. Khan M.N.I. Matin M.A. Amin N. 57204121738 34867805900 57219816966 56610978700 57220488718 7102424614 Cadmium sulfide; Cadmium telluride; Copper compounds; Deposition rates; Energy gap; II-VI semiconductors; Lime; Magnetron sputtering; Refractive index; Substrates; Sulfur compounds; Thin film solar cells; Tin compounds; Zinc sulfide; Absorption co-efficient; Complex refractive index; Interference fringe pattern; Methodological frameworks; Optical characterization; RF magnetron sputtering technique; Soda lime glass substrate; Transmittance spectra; Thin films Thin film Cadmium Sulfide (CdS) is a common n-type heteropartner for thin film Cadmium Telluride, Copper Indium Gallium Selenium and Copper Tin Zinc Sulfide based solar cells. This work reports the optical properties of CdS thin films which were synthesized onto soda-lime glass substrate by RF magnetron sputtering technique for different RF power. Analyzing the interference fringe pattern of the transmittance spectra and using the methodological framework of Swanepoel method, the film thickness as well as the deposition rate versus RF power characteristics has been deduced. The estimated thickness of the deposited CdS films were compared with the measured thickness by Dektak profilometer and found satisfactory. The deposition rate versus RF power characteristics offers an optimized recipe for fabricating CdS thin films of controlled thickness. In addition, optical energy bandgap, absorption coefficient and wavelength dependent complex refractive index have been calculated. The calculated bandgap energy values of the as-grown CdS films are around 2.42 eV to 2.44 eV and the complex refractive index lies the range of 2.35 to 2.50. Using this data researchers will be able to deposit CdS films of controlled thickness according to the needs. � 2020 IEEE. Final 2023-05-29T08:09:32Z 2023-05-29T08:09:32Z 2020 Conference Paper 10.1109/TENSYMP50017.2020.9230706 2-s2.0-85096423848 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85096423848&doi=10.1109%2fTENSYMP50017.2020.9230706&partnerID=40&md5=989db7912d66400db48885e001f86fb2 https://irepository.uniten.edu.my/handle/123456789/25448 9230706 1010 1013 Institute of Electrical and Electronics Engineers Inc. Scopus |
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Cadmium sulfide; Cadmium telluride; Copper compounds; Deposition rates; Energy gap; II-VI semiconductors; Lime; Magnetron sputtering; Refractive index; Substrates; Sulfur compounds; Thin film solar cells; Tin compounds; Zinc sulfide; Absorption co-efficient; Complex refractive index; Interference fringe pattern; Methodological frameworks; Optical characterization; RF magnetron sputtering technique; Soda lime glass substrate; Transmittance spectra; Thin films |
| author2 |
57204121738 |
| author_facet |
57204121738 Ahamed E.M.K.I. Das N.K. Farhad S.F.U. Khan M.N.I. Matin M.A. Amin N. |
| format |
Conference Paper |
| author |
Ahamed E.M.K.I. Das N.K. Farhad S.F.U. Khan M.N.I. Matin M.A. Amin N. |
| spellingShingle |
Ahamed E.M.K.I. Das N.K. Farhad S.F.U. Khan M.N.I. Matin M.A. Amin N. Optical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rate |
| author_sort |
Ahamed E.M.K.I. |
| title |
Optical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rate |
| title_short |
Optical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rate |
| title_full |
Optical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rate |
| title_fullStr |
Optical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rate |
| title_full_unstemmed |
Optical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rate |
| title_sort |
optical characterization of sputter deposited cds thin films and measurement of deposition rate |
| publisher |
Institute of Electrical and Electronics Engineers Inc. |
| publishDate |
2023 |
| _version_ |
1806423354625753088 |
| score |
13.214268 |