Structural properties of CdS thin-films deposited by RF magnetron sputtering
Buffer layers; Cadmium sulfide; Chromium compounds; Copper compounds; Crystal structure; Crystallite size; Dislocations (crystals); II-VI semiconductors; Magnetron sputtering; Photoelectrochemical cells; Photovoltaic cells; Structural properties; Sulfur compounds; X ray diffraction; As-deposited fil...
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Institute of Electrical and Electronics Engineers Inc.
2023
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my.uniten.dspace-244592023-05-29T15:23:41Z Structural properties of CdS thin-films deposited by RF magnetron sputtering Ahamed E.M.K.I. Gupta A.K.S. Khan M.N.I. Matin M.A. Amin N. 57204121738 57203811680 56610978700 57220488718 7102424614 Buffer layers; Cadmium sulfide; Chromium compounds; Copper compounds; Crystal structure; Crystallite size; Dislocations (crystals); II-VI semiconductors; Magnetron sputtering; Photoelectrochemical cells; Photovoltaic cells; Structural properties; Sulfur compounds; X ray diffraction; As-deposited films; Crystalline properties; Crystalline quality; Dislocation densities; rf-Magnetron sputtering; Rf-sputtering; Sputtering conditions; Thin film photovoltaic cells; Thin films Cadmium Sulfide (CdS) thin-films were deposited by RF magnetron sputtering at different RF power ambient and their structural properties were studied to observe the effect of different sputtering conditions on the structural properties of CdS films. CdS is widely used buffer layer for chalcopyrite based photovoltaic cells and requires good crystalline property and less dislocation density as well as strain in conjunction with a thinner layer ensures good crystalline quality. The as deposited films were characterized by X-ray diffraction and the structural properties (crystal type, lattice alignment, lattice constant, crystalline size, microstrain, dislocation density, etc.) were analyzed. Analysis on structural properties shows that crystallite size increases and crystalline quality enhanced with higher RF power, while the dislocation density and developed strain declined for the same conditions. This investigation concluded that higher RF power sputtered CdS thin-films for lower time deposition can be more suitable for thin-film photovoltaic cell applications. � 2019 IEEE. Final 2023-05-29T07:23:41Z 2023-05-29T07:23:41Z 2019 Conference Paper 10.1109/ICAEE48663.2019.8975522 2-s2.0-85079358432 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85079358432&doi=10.1109%2fICAEE48663.2019.8975522&partnerID=40&md5=29afee6c457095c1fa8d824f5ff52d25 https://irepository.uniten.edu.my/handle/123456789/24459 8975522 581 584 Institute of Electrical and Electronics Engineers Inc. Scopus |
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Buffer layers; Cadmium sulfide; Chromium compounds; Copper compounds; Crystal structure; Crystallite size; Dislocations (crystals); II-VI semiconductors; Magnetron sputtering; Photoelectrochemical cells; Photovoltaic cells; Structural properties; Sulfur compounds; X ray diffraction; As-deposited films; Crystalline properties; Crystalline quality; Dislocation densities; rf-Magnetron sputtering; Rf-sputtering; Sputtering conditions; Thin film photovoltaic cells; Thin films |
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57204121738 |
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57204121738 Ahamed E.M.K.I. Gupta A.K.S. Khan M.N.I. Matin M.A. Amin N. |
| format |
Conference Paper |
| author |
Ahamed E.M.K.I. Gupta A.K.S. Khan M.N.I. Matin M.A. Amin N. |
| spellingShingle |
Ahamed E.M.K.I. Gupta A.K.S. Khan M.N.I. Matin M.A. Amin N. Structural properties of CdS thin-films deposited by RF magnetron sputtering |
| author_sort |
Ahamed E.M.K.I. |
| title |
Structural properties of CdS thin-films deposited by RF magnetron sputtering |
| title_short |
Structural properties of CdS thin-films deposited by RF magnetron sputtering |
| title_full |
Structural properties of CdS thin-films deposited by RF magnetron sputtering |
| title_fullStr |
Structural properties of CdS thin-films deposited by RF magnetron sputtering |
| title_full_unstemmed |
Structural properties of CdS thin-films deposited by RF magnetron sputtering |
| title_sort |
structural properties of cds thin-films deposited by rf magnetron sputtering |
| publisher |
Institute of Electrical and Electronics Engineers Inc. |
| publishDate |
2023 |
| _version_ |
1806426299833516032 |
| score |
13.188404 |