Two stages fault detection method based on error, applied in EBM facility
Data driven technique is a well-known method in fault detection and it is suitable for large industrial systems. In this article, this technique is applied in an electron beam (EB) facility to assist the technology available in that facility so that the number and cost of equipment/component failure...
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| 主要な著者: | , |
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| フォーマット: | Conference Paper |
| 出版事項: |
American Institute of Physics Inc.
2023
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