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Power Electronics Building Block (PEBB) hardware design and reliability prediction

Architectural design; Failure analysis; Hardware; Power converters; Power electronics; Reliability; Reliability analysis; Software design; Stress analysis; Communication interface; Failure rate; Hardware and software designs; Modular multilevel converters; Power Electronics Building Blocks; Power el...

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Main Authors: Toh C.L., Wong Y.M., Norum L.E.
Other Authors: 8690228000
Format: Conference Paper
Published: Institute of Electrical and Electronics Engineers Inc. 2023
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spelling my.uniten.dspace-231802023-05-29T14:38:14Z Power Electronics Building Block (PEBB) hardware design and reliability prediction Toh C.L. Wong Y.M. Norum L.E. 8690228000 57194947416 6701577565 Architectural design; Failure analysis; Hardware; Power converters; Power electronics; Reliability; Reliability analysis; Software design; Stress analysis; Communication interface; Failure rate; Hardware and software designs; Modular multilevel converters; Power Electronics Building Blocks; Power electronics converters; Reliability block diagrams; Reliability prediction; Outages Power Electronics Building Block (PEBB) concept has been proposed to simplify the conventional design process and reduce engineering efforts. The main idea of PEBB is to standardize the hardware and software design. A PEBB hardware is a power processor which integrates different groups of hardware components such as power semiconductors, sensing measurements and communication interface elements. Different range of power converters can be constructed easily by connecting a number of identical PEBBs in series and/or parallel. However, failure of a PEBB will degrade the reliability level of these converters. To prevent system breakdown, the life span of a PEBB hardware must be estimated so that maintenance works can be planned ahead. Therefore, this paper demonstrates part stress analysis to estimate a useful-life-cycle (Mean Time To Failure) of a well-developed PEBB hardware prototype. This PEBB has been used to construct a small-scaled modular multilevel converter for laboratory testing. Full reliability block diagram analysis and simplification techniques are enclosed. � 2016 IEEE. Final 2023-05-29T06:38:14Z 2023-05-29T06:38:14Z 2017 Conference Paper 10.1109/PECON.2016.7951553 2-s2.0-85024403514 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85024403514&doi=10.1109%2fPECON.2016.7951553&partnerID=40&md5=861b1a6206c9161c229a4f016c0e3c18 https://irepository.uniten.edu.my/handle/123456789/23180 7951553 166 171 Institute of Electrical and Electronics Engineers Inc. Scopus
institution Universiti Tenaga Nasional
building UNITEN Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Tenaga Nasional
content_source UNITEN Institutional Repository
url_provider http://dspace.uniten.edu.my/
description Architectural design; Failure analysis; Hardware; Power converters; Power electronics; Reliability; Reliability analysis; Software design; Stress analysis; Communication interface; Failure rate; Hardware and software designs; Modular multilevel converters; Power Electronics Building Blocks; Power electronics converters; Reliability block diagrams; Reliability prediction; Outages
author2 8690228000
author_facet 8690228000
Toh C.L.
Wong Y.M.
Norum L.E.
format Conference Paper
author Toh C.L.
Wong Y.M.
Norum L.E.
spellingShingle Toh C.L.
Wong Y.M.
Norum L.E.
Power Electronics Building Block (PEBB) hardware design and reliability prediction
author_sort Toh C.L.
title Power Electronics Building Block (PEBB) hardware design and reliability prediction
title_short Power Electronics Building Block (PEBB) hardware design and reliability prediction
title_full Power Electronics Building Block (PEBB) hardware design and reliability prediction
title_fullStr Power Electronics Building Block (PEBB) hardware design and reliability prediction
title_full_unstemmed Power Electronics Building Block (PEBB) hardware design and reliability prediction
title_sort power electronics building block (pebb) hardware design and reliability prediction
publisher Institute of Electrical and Electronics Engineers Inc.
publishDate 2023
_version_ 1806427891563495424
score 13.214268

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