Constrained–Optimization-based Bayesian posterior probability extreme learning machine for pattern classification

• Main Authors: Wong S.Y., Yap K.S.
• Other Authors: 55812054100
• Format: Conference Paper
• Published: Springer Verlag 2023

Extreme Learning Machine (ELM) has drawn overwhelming attention from various fields notably in neural network researches for being an efficient algorithm. Using random computational hidden neurons, ELM shows faster learning speed over the traditional learning algorithms. Furthermore, it is stated th...