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Comparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flash

THS TK7895.K66 2014

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Main Author: Kong Kah Wai
Format: text::Thesis
Language:English
Published: 2023
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id my.uniten.dspace-19531
record_format dspace
spelling my.uniten.dspace-195312023-05-04T20:32:00Z Comparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flash Kong Kah Wai THS TK7895.K66 2014 2023-05-03T13:36:35Z 2023-05-03T13:36:35Z 2014-01 Resource Types::text::Thesis https://irepository.uniten.edu.my/handle/123456789/19531 en application/pdf
institution Universiti Tenaga Nasional
building UNITEN Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Tenaga Nasional
content_source UNITEN Institutional Repository
url_provider http://dspace.uniten.edu.my/
language English
description THS TK7895.K66 2014
format Resource Types::text::Thesis
author Kong Kah Wai
spellingShingle Kong Kah Wai
Comparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flash
author_facet Kong Kah Wai
author_sort Kong Kah Wai
title Comparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flash
title_short Comparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flash
title_full Comparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flash
title_fullStr Comparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flash
title_full_unstemmed Comparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flash
title_sort comparison reliability performance of single bit ecc and multi bit ecc for slc nand flash
publishDate 2023
_version_ 1806426165903097856
score 13.214268

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