Experimental investigation of high-speed digital circuit’s return current on electromagnetic emission

• 主要な著者: Saizalmursidi, Md Mustam, Mohd Zarar, Mohd Jenu
• フォーマット: Working Paper
• 言語: English
• 出版事項: Universiti Malaysia Pahang (UMP) 2010
• 主題: Electromagnetic emission; High-speed digital circuit; Guard trace; Emission reduction; Malaysian Technical Universities Conference on Engineering and Technology (MUCEET)
• オンライン･アクセス: http://dspace.unimap.edu.my/xmlui/handle/123456789/8626

MUCEET 2009 is organized by Malaysian Technical Universities Network (MTUN) comprising of Universiti Malaysia Perlis (UniMAP), Universiti Tun Hussein Onn (UTHM), Universiti Teknikal Melaka (UTeM) and Universiti Malaysia Pahang (UMP), 20th - 22nd June 2009 at M. S. Garden Hotel, Kuantan, Pahang.