Development of nanogap automated permittivity measurement system for DNA hybridization detection kit

Link to publisher's homepage at http://ieeexplore.ieee.org/

Saved in:
Bibliographic Details
Main Authors: Saifullah, A., Azri, M. E., Uda, Hashim, Prof. Dr.
Format: Working Paper
Language:English
Published: Institute of Electrical and Electronics Engineering (IEEE) 2010
Subjects:
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/8447
Tags: Add Tag
No Tags, Be the first to tag this record!
id my.unimap-8447
record_format dspace
spelling my.unimap-84472013-11-20T03:53:31Z Development of nanogap automated permittivity measurement system for DNA hybridization detection kit Saifullah, A. Azri, M. E. Uda, Hashim, Prof. Dr. Automated measurement systems Current waves DNA sensors Double-stranded DNA (ds-DNA) Nano-gap Permittivity values Single-stranded DNA (ss-DNA) Link to publisher's homepage at http://ieeexplore.ieee.org/ The Nanogap Automated Permittivity Measurement System (APMS) are fabricated as low cost, portable and label free DNA hybridization detection kit. The nanogap capacitor can react as a dna sensor. The difference in dielectric properties of singlestranded DNA (SSDNA) and double-stranded DNA (DSDNA) are allowing the use of permittivity measurement for DNA hybridization detection. In this project, an automated measurement system is introduced as an interface for nanogap capacitor. Sine wave frequency from 1Hz until 100kHz will be applied to the nanogap capacitor and it voltage wave and current wave are measured and analyzed. Three measurements will be made, capacitance measurement of nanogap with no sample, permittivity measurement of after immobilization and after hybridization. If the measurement show a considerably difference in permittivity value, the DNA is consider hybridize. Otherwise is it considered mismatch. In this project, an Artificial Neural Network (ANN) will also be introduced for decision making of the result based on the permittivity measurement. This will allow the user to get the result without comparing the output. 2010-08-03T08:54:58Z 2010-08-03T08:54:58Z 2009-12-14 Working Paper p.1-4 978-142445223-1 http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5412092&tag=1 http://hdl.handle.net/123456789/8447 en Proceedings of the International Conference for Technical Postgraduates (TECHPOS) 2009 Institute of Electrical and Electronics Engineering (IEEE)
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Automated measurement systems
Current waves
DNA sensors
Double-stranded DNA (ds-DNA)
Nano-gap
Permittivity values
Single-stranded DNA (ss-DNA)
spellingShingle Automated measurement systems
Current waves
DNA sensors
Double-stranded DNA (ds-DNA)
Nano-gap
Permittivity values
Single-stranded DNA (ss-DNA)
Saifullah, A.
Azri, M. E.
Uda, Hashim, Prof. Dr.
Development of nanogap automated permittivity measurement system for DNA hybridization detection kit
description Link to publisher's homepage at http://ieeexplore.ieee.org/
format Working Paper
author Saifullah, A.
Azri, M. E.
Uda, Hashim, Prof. Dr.
author_facet Saifullah, A.
Azri, M. E.
Uda, Hashim, Prof. Dr.
author_sort Saifullah, A.
title Development of nanogap automated permittivity measurement system for DNA hybridization detection kit
title_short Development of nanogap automated permittivity measurement system for DNA hybridization detection kit
title_full Development of nanogap automated permittivity measurement system for DNA hybridization detection kit
title_fullStr Development of nanogap automated permittivity measurement system for DNA hybridization detection kit
title_full_unstemmed Development of nanogap automated permittivity measurement system for DNA hybridization detection kit
title_sort development of nanogap automated permittivity measurement system for dna hybridization detection kit
publisher Institute of Electrical and Electronics Engineering (IEEE)
publishDate 2010
url http://dspace.unimap.edu.my/xmlui/handle/123456789/8447
_version_ 1643789187037528064
score 13.214268