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Reliability and Testability in Integrated Circuit Design

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Main Author: Universiti Malaysia Perlis (UniMAP)
Format: Other
Language:English
Published: Universiti Malaysia Perlis (UniMAP) 2023
Subjects:
Examination paper
NMJ 30803 > Test
Reliability and Testability in Integrated Circuit Design > Examination paper
Ketahanan dan Kebolehujian dalam Rekabentuk Litar Terkamir > Examination paper
Online Access:http://dspace.unimap.edu.my:80/xmlui/handle/123456789/78708
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id my.unimap-78708
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spelling my.unimap-787082023-05-11T01:33:55Z Reliability and Testability in Integrated Circuit Design Ketahanan dan Kebolehujian dalam Rekabentuk Litar Terkamir Universiti Malaysia Perlis (UniMAP) Examination paper NMJ 30803 -- Test Reliability and Testability in Integrated Circuit Design -- Examination paper Ketahanan dan Kebolehujian dalam Rekabentuk Litar Terkamir -- Examination paper 2023-05 2023-05-11T01:32:17Z 2023-05-11T01:32:17Z 2023-02 Other 7 p. http://dspace.unimap.edu.my:80/xmlui/handle/123456789/78708 en NMJ 30803;Semester 1 2022/2023 Universiti Malaysia Perlis (UniMAP)
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Examination paper
NMJ 30803 -- Test
Reliability and Testability in Integrated Circuit Design -- Examination paper
Ketahanan dan Kebolehujian dalam Rekabentuk Litar Terkamir -- Examination paper
spellingShingle Examination paper
NMJ 30803 -- Test
Reliability and Testability in Integrated Circuit Design -- Examination paper
Ketahanan dan Kebolehujian dalam Rekabentuk Litar Terkamir -- Examination paper
Universiti Malaysia Perlis (UniMAP)
Reliability and Testability in Integrated Circuit Design
format Other
author Universiti Malaysia Perlis (UniMAP)
author_facet Universiti Malaysia Perlis (UniMAP)
author_sort Universiti Malaysia Perlis (UniMAP)
title Reliability and Testability in Integrated Circuit Design
title_short Reliability and Testability in Integrated Circuit Design
title_full Reliability and Testability in Integrated Circuit Design
title_fullStr Reliability and Testability in Integrated Circuit Design
title_full_unstemmed Reliability and Testability in Integrated Circuit Design
title_sort reliability and testability in integrated circuit design
publisher Universiti Malaysia Perlis (UniMAP)
publishDate 2023
url http://dspace.unimap.edu.my:80/xmlui/handle/123456789/78708
_version_ 1772813202268094464
score 13.214268

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