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Preparation and characterization of nanostructured ITO Thin Films by Spray Pyrolysis Technique: Dependence on annealing temperature

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Bibliographic Details
Main Author: Salam Amir Yousif
Other Authors: salammomica@uomustansiriyah.edu.iq
Format: Article
Language:English
Published: Universiti Malaysia Perlis (UniMAP) 2023
Subjects:
Thin films
structural properties
optical properties
spray pyrolysis
nanostructure
annealing temperature
Online Access:http://dspace.unimap.edu.my:80/xmlui/handle/123456789/78113
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spelling my.unimap-781132023-03-09T04:32:12Z Preparation and characterization of nanostructured ITO Thin Films by Spray Pyrolysis Technique: Dependence on annealing temperature Salam Amir Yousif salammomica@uomustansiriyah.edu.iq Department of Physics, College of Education, Mustansiriyah University, Baghdad – Iraq Thin films structural properties optical properties spray pyrolysis nanostructure annealing temperature Link to publisher's homepage at http://ijneam.unimap.edu.my/ Transparent conducting oxides (TCOs) like Indium tin oxide (ITO) have wide attention from all scientists which have low resistance and high visible light transmittance, used as transparent electrodes in many optoelectronic devices such as liquid crystal displays, touch screens, light emitting diodes, and solar cells. In this research, the relationship between the crystallization, optical transmittance, and surface roughness of nanostructured ITO thin films and the change in annealing temperature was investigated. To enhance the efficiency of this material in optoelectronic applications, both the optical transmittance in the visible region and the crystallite size must be increased. These results can be obtained by the heat treatment of the films. Nanostructured ITO thin layer films have been successfully prepared at a substrate temperature equal to (350)℃ by chemical spray pyrolysis (CSP) technique. The physical characterizations of nanostructured ITO thin layer films were investigated at different annealing temperatures (400, 450 500)℃. The presence of diffraction peaks indicates that the as-deposited and post annealed films are polycrystalline cubic structure and the peak (400) is a preferred growth orientation. For all samples the value of intensity of diffraction peaks increases with increasing substrate temperature. The crystallite size of nanostructured ITO thin films is strongly related to the annealing temperature. The crystallite size estimated from XRD was found to rise with rising annealing temperature. The surface roughness of nanostructured ITO thin layer films increases with rising annealing temperature. High values of transmittance have been measured in the visible region 550 nm equal to (70, 82, 84 and 88)% corresponding to annealing temperature (350, 400, 450 500)℃ respectively. 2023-03-09T04:32:11Z 2023-03-09T04:32:11Z 2023-01 Article International Journal of Nanoelectronics and Materials, vol.16(1), 2023, pages 33-42 1985-5761 (Printed) 1997-4434 (Online) http://dspace.unimap.edu.my:80/xmlui/handle/123456789/78113 en Universiti Malaysia Perlis (UniMAP)
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Thin films
structural properties
optical properties
spray pyrolysis
nanostructure
annealing temperature
spellingShingle Thin films
structural properties
optical properties
spray pyrolysis
nanostructure
annealing temperature
Salam Amir Yousif
Preparation and characterization of nanostructured ITO Thin Films by Spray Pyrolysis Technique: Dependence on annealing temperature
description Link to publisher's homepage at http://ijneam.unimap.edu.my/
author2 salammomica@uomustansiriyah.edu.iq
author_facet salammomica@uomustansiriyah.edu.iq
Salam Amir Yousif
format Article
author Salam Amir Yousif
author_sort Salam Amir Yousif
title Preparation and characterization of nanostructured ITO Thin Films by Spray Pyrolysis Technique: Dependence on annealing temperature
title_short Preparation and characterization of nanostructured ITO Thin Films by Spray Pyrolysis Technique: Dependence on annealing temperature
title_full Preparation and characterization of nanostructured ITO Thin Films by Spray Pyrolysis Technique: Dependence on annealing temperature
title_fullStr Preparation and characterization of nanostructured ITO Thin Films by Spray Pyrolysis Technique: Dependence on annealing temperature
title_full_unstemmed Preparation and characterization of nanostructured ITO Thin Films by Spray Pyrolysis Technique: Dependence on annealing temperature
title_sort preparation and characterization of nanostructured ito thin films by spray pyrolysis technique: dependence on annealing temperature
publisher Universiti Malaysia Perlis (UniMAP)
publishDate 2023
url http://dspace.unimap.edu.my:80/xmlui/handle/123456789/78113
_version_ 1772813132958269440
score 13.222552

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