Description: Experimental performance analysis of fabricated Si/Ge thin film structure

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Bibliographic Details
Main Authors:	Eladl, Sh. M., Sharshar, K. A.
Other Authors:	shaban_45@yahoo.com
Format:	Article
Language:	English
Published:	Universiti Malaysia Perlis (UniMAP) 2023
Subjects:	Capacitance–Voltage (C-V) SiGe thin films Electron beam evaporator MOS capacitor
Online Access:	http://dspace.unimap.edu.my:80/xmlui/handle/123456789/78108
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Summary:	Link to publisher's homepage at http://ijneam.unimap.edu.my/