Microstructure evolution of Ag/TiO₂ thin film
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2022
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my.unimap-747522022-03-23T01:17:30Z Microstructure evolution of Ag/TiO₂ thin film Dewi Suriyani, Che Halin Dewi Suriyani, Che Halin Kamrosni, Abdul Razak Mohd Arif Anuar, Mohd Salleh Mohd Izrul Izwan, Ramli Mohd Mustafa Al Bakri, Abdullah Ayu Wazira, Azhari Kazuhiro, Nogita Hideyuki, Yasuda Nabiałek, Marcin Wysłocki, Jerzy J. dewisuriyani@unimap.edu.my Center of Excellence Geopolymer and Green Technology (CEGeoGTech), School of Materials Engineering, Universiti Malaysia Perlis (UniMAP) Faculty of Chemical Engineering Technology, Universiti Malaysia Perlis (UniMAP) Faculty of Civil Engineering Technology, Universiti Malaysia Perlis (UniMAP) School of Mechanical and Mining Engineering, The University of Queensland (UQ) Department of Materials Science and Engineering, Kyoto University Department of Physics, Czestochowa University of Technology Microstructure Titanium dioxide Thin film Sol-Gel Synchrotron radiation imaging Link to publisher's homepage at https://www.mdpi.com/journal/magnetochemistry Ag/TiO₂ thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of the prepared Ag/TiO₂ thin films were elucidated using real-time synchrotron radiation imaging, its structure was determined using grazing incidence X-ray diffraction (GIXRD), its morphology was imaged using the field emission scanning electron microscopy (FESEM), and its surface topography was examined using the atomic force microscope (AFM) in contact mode. The cubical shape was detected and identified as Ag, while the anatase, TiO₂ thin film resembled a porous ring-like structure. It was found that each ring that coalesced and formed channels occurred at a low annealing temperature of 280 °C. The energy dispersive X-ray (EDX) result revealed a small amount of Ag presence in the Ag/TiO₂ thin films. From the in-situ synchrotron radiation imaging, it was observed that as the annealing time increased, the growth of Ag/TiO₂ also increased in terms of area and the number of junctions. The growth rate of Ag/TiO₂ at 600 s was 47.26 µm²/s, and after 1200 s it decreased to 11.50 µm²/s and 11.55 µm²/s at 1800 s. Prolonged annealing will further decrease the growth rate to 5.94 µm²/s, 4.12 µm2/s and 4.86 µm²/s at 2400 s, 3000 s and 3600 s, respectively. 2022 2022-03-23T01:05:20Z 2022-03-23T01:05:20Z 2021-01 Article Magnetochemistry, vol.7(1), 2021, 10 pages 2312-7481 http://dspace.unimap.edu.my:80/xmlui/handle/123456789/74752 https://doi.org/10.3390/magnetochemistry7010014 en MDPI AG |
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English |
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Microstructure Titanium dioxide Thin film Sol-Gel Synchrotron radiation imaging |
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Microstructure Titanium dioxide Thin film Sol-Gel Synchrotron radiation imaging Dewi Suriyani, Che Halin Dewi Suriyani, Che Halin Kamrosni, Abdul Razak Mohd Arif Anuar, Mohd Salleh Mohd Izrul Izwan, Ramli Mohd Mustafa Al Bakri, Abdullah Ayu Wazira, Azhari Kazuhiro, Nogita Hideyuki, Yasuda Nabiałek, Marcin Wysłocki, Jerzy J. Microstructure evolution of Ag/TiO₂ thin film |
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Link to publisher's homepage at https://www.mdpi.com/journal/magnetochemistry |
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dewisuriyani@unimap.edu.my |
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dewisuriyani@unimap.edu.my Dewi Suriyani, Che Halin Dewi Suriyani, Che Halin Kamrosni, Abdul Razak Mohd Arif Anuar, Mohd Salleh Mohd Izrul Izwan, Ramli Mohd Mustafa Al Bakri, Abdullah Ayu Wazira, Azhari Kazuhiro, Nogita Hideyuki, Yasuda Nabiałek, Marcin Wysłocki, Jerzy J. |
| format |
Article |
| author |
Dewi Suriyani, Che Halin Dewi Suriyani, Che Halin Kamrosni, Abdul Razak Mohd Arif Anuar, Mohd Salleh Mohd Izrul Izwan, Ramli Mohd Mustafa Al Bakri, Abdullah Ayu Wazira, Azhari Kazuhiro, Nogita Hideyuki, Yasuda Nabiałek, Marcin Wysłocki, Jerzy J. |
| author_sort |
Dewi Suriyani, Che Halin |
| title |
Microstructure evolution of Ag/TiO₂ thin film |
| title_short |
Microstructure evolution of Ag/TiO₂ thin film |
| title_full |
Microstructure evolution of Ag/TiO₂ thin film |
| title_fullStr |
Microstructure evolution of Ag/TiO₂ thin film |
| title_full_unstemmed |
Microstructure evolution of Ag/TiO₂ thin film |
| title_sort |
microstructure evolution of ag/tio₂ thin film |
| publisher |
MDPI AG |
| publishDate |
2022 |
| url |
http://dspace.unimap.edu.my:80/xmlui/handle/123456789/74752 |
| _version_ |
1729704801685471232 |
| score |
13.222552 |