Degradation of single layer MEH-PPV organic light emitting diode (OLED)
Link to publisher's homepage at http://ieeexplore.ieee.org
Saved in:
Main Authors: | , , |
---|---|
Format: | Article |
Language: | English |
Published: |
Institute of Electrical and Electronics Engineering (IEEE)
2009
|
Subjects: | |
Online Access: | http://dspace.unimap.edu.my/xmlui/handle/123456789/6683 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
id |
my.unimap-6683 |
---|---|
record_format |
dspace |
spelling |
my.unimap-66832010-11-23T05:11:09Z Degradation of single layer MEH-PPV organic light emitting diode (OLED) Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim Electroluminescences Scanning electron microscopy (SEM) Organic light emitting diodes Light emitting diodes Semiconductors Link to publisher's homepage at http://ieeexplore.ieee.org The degradation process of a single layer electroluminescence (EL) polymer MEH-PPV organic light emitting diode (OLED) with the MEH-PPV thickness of 57plusmn3 nm is discussed. Typical structure of OLED fabrication is Al/MEH-PPV/ITO (indium tin oxide). Electroluminescence (EL) spectrum indicates that the emission of MEH-PPV device is the yellow orange color. The device degrades by days as demonstrated by the increased in the turn on voltage obtained from I/V curves. The scanning electron microscope (SEM) images show some bubbles emerge on the surface of the device after an electric field was applied to it. 2009-08-06T10:09:18Z 2009-08-06T10:09:18Z 2006 Article p.112-115 4266580 http://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4266580 http://hdl.handle.net/123456789/6683 en Proceedings of IEEE International Conference on Semiconductor Electronics (ICSE 2006) Institute of Electrical and Electronics Engineering (IEEE) |
institution |
Universiti Malaysia Perlis |
building |
UniMAP Library |
collection |
Institutional Repository |
continent |
Asia |
country |
Malaysia |
content_provider |
Universiti Malaysia Perlis |
content_source |
UniMAP Library Digital Repository |
url_provider |
http://dspace.unimap.edu.my/ |
language |
English |
topic |
Electroluminescences Scanning electron microscopy (SEM) Organic light emitting diodes Light emitting diodes Semiconductors |
spellingShingle |
Electroluminescences Scanning electron microscopy (SEM) Organic light emitting diodes Light emitting diodes Semiconductors Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim Degradation of single layer MEH-PPV organic light emitting diode (OLED) |
description |
Link to publisher's homepage at http://ieeexplore.ieee.org |
format |
Article |
author |
Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim |
author_facet |
Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim |
author_sort |
Nurjuliana, Juhari |
title |
Degradation of single layer MEH-PPV organic light emitting diode (OLED) |
title_short |
Degradation of single layer MEH-PPV organic light emitting diode (OLED) |
title_full |
Degradation of single layer MEH-PPV organic light emitting diode (OLED) |
title_fullStr |
Degradation of single layer MEH-PPV organic light emitting diode (OLED) |
title_full_unstemmed |
Degradation of single layer MEH-PPV organic light emitting diode (OLED) |
title_sort |
degradation of single layer meh-ppv organic light emitting diode (oled) |
publisher |
Institute of Electrical and Electronics Engineering (IEEE) |
publishDate |
2009 |
url |
http://dspace.unimap.edu.my/xmlui/handle/123456789/6683 |
_version_ |
1643788576534560768 |
score |
13.214268 |