Degradation of single layer MEH-PPV organic light emitting diode (OLED)

Link to publisher's homepage at http://ieeexplore.ieee.org

Saved in:
Bibliographic Details
Main Authors: Nurjuliana, Juhari, Wan Haliza, Abd. Majid, Zainol Abidin, Ibrahim
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineering (IEEE) 2009
Subjects:
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/6683
Tags: Add Tag
No Tags, Be the first to tag this record!
id my.unimap-6683
record_format dspace
spelling my.unimap-66832010-11-23T05:11:09Z Degradation of single layer MEH-PPV organic light emitting diode (OLED) Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim Electroluminescences Scanning electron microscopy (SEM) Organic light emitting diodes Light emitting diodes Semiconductors Link to publisher's homepage at http://ieeexplore.ieee.org The degradation process of a single layer electroluminescence (EL) polymer MEH-PPV organic light emitting diode (OLED) with the MEH-PPV thickness of 57plusmn3 nm is discussed. Typical structure of OLED fabrication is Al/MEH-PPV/ITO (indium tin oxide). Electroluminescence (EL) spectrum indicates that the emission of MEH-PPV device is the yellow orange color. The device degrades by days as demonstrated by the increased in the turn on voltage obtained from I/V curves. The scanning electron microscope (SEM) images show some bubbles emerge on the surface of the device after an electric field was applied to it. 2009-08-06T10:09:18Z 2009-08-06T10:09:18Z 2006 Article p.112-115 4266580 http://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4266580 http://hdl.handle.net/123456789/6683 en Proceedings of IEEE International Conference on Semiconductor Electronics (ICSE 2006) Institute of Electrical and Electronics Engineering (IEEE)
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Electroluminescences
Scanning electron microscopy (SEM)
Organic light emitting diodes
Light emitting diodes
Semiconductors
spellingShingle Electroluminescences
Scanning electron microscopy (SEM)
Organic light emitting diodes
Light emitting diodes
Semiconductors
Nurjuliana, Juhari
Wan Haliza, Abd. Majid
Zainol Abidin, Ibrahim
Degradation of single layer MEH-PPV organic light emitting diode (OLED)
description Link to publisher's homepage at http://ieeexplore.ieee.org
format Article
author Nurjuliana, Juhari
Wan Haliza, Abd. Majid
Zainol Abidin, Ibrahim
author_facet Nurjuliana, Juhari
Wan Haliza, Abd. Majid
Zainol Abidin, Ibrahim
author_sort Nurjuliana, Juhari
title Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_short Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_full Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_fullStr Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_full_unstemmed Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_sort degradation of single layer meh-ppv organic light emitting diode (oled)
publisher Institute of Electrical and Electronics Engineering (IEEE)
publishDate 2009
url http://dspace.unimap.edu.my/xmlui/handle/123456789/6683
_version_ 1643788576534560768
score 13.222552