Modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors

Link to publisher's homepage at http://www.unimap.edu.my/ ; Open access only applicable for vol. 1; issue 1, 2008 & vol. 2; issue 1, 2009.

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Main Authors: Bourezig, Y., Bouabdallah, B., Mansouri, S., Gaffiot, F.
Format: Article
Language:English
Published: Universiti Malaysia Perlis 2009
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Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/5343
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spelling my.unimap-53432009-11-25T08:47:04Z Modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors Bourezig, Y. Bouabdallah, B. Mansouri, S. Gaffiot, F. Thin-Film Transistor Field Effect Mobility Dangling bonds Band tails Thin films Thin film devices Silicon Thin film transistors Link to publisher's homepage at http://www.unimap.edu.my/ ; Open access only applicable for vol. 1; issue 1, 2008 & vol. 2; issue 1, 2009. The transfer characteristics modelisation of the Mosfet's structure allows us to simulate the doping effect, the grains size, the layer thickness as well as others parameters of the transistor. The purpose of this work is to study the effect of the layer thickness on the carrier's mobility in the channel. For that, a two-dimensional modelling of the electrical conduction in amorphous silicon Mosfet's is used. It is based on the solving of Poisson's equation and the two continuity current equations of electrons and holes, and takes into account of the properties of polysilicon material, such as a density of trapped states formed by two exponential band tails, and gaussian state distribution for the charge carriers. The numerical model assumes a drift- diffusion mechanism in the crystalline regions in series with a thermionic emission mechanism for carriers overcoming the grain boundary potential barrier. In order to validate the conduction model, we also incorporate the effect of the electrical field on the generation carriers at grain boundary traps. The transfer characteristics are studied in function of film thickness, then the carrier's mobility. The results show that, the surface field affects only the low thicknesses, the variation of this field as a fucntion of film thickness is sufficient to expalin the behaviour of channel mobility. For high thicknesses, the field effect mobility is controlled by intergranular barriers of potential. 2009-04-07T03:06:03Z 2009-04-07T03:06:03Z 2009 Article International Journal of Nanoelectronics and Materials, vol. 2 (1), 2009, pages 63-74. 1985-5761 (Printed) 1997-4434 (Online) http://hdl.handle.net/123456789/5343 en Universiti Malaysia Perlis
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Thin-Film Transistor
Field Effect Mobility
Dangling bonds
Band tails
Thin films
Thin film devices
Silicon
Thin film transistors
spellingShingle Thin-Film Transistor
Field Effect Mobility
Dangling bonds
Band tails
Thin films
Thin film devices
Silicon
Thin film transistors
Bourezig, Y.
Bouabdallah, B.
Mansouri, S.
Gaffiot, F.
Modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors
description Link to publisher's homepage at http://www.unimap.edu.my/ ; Open access only applicable for vol. 1; issue 1, 2008 & vol. 2; issue 1, 2009.
format Article
author Bourezig, Y.
Bouabdallah, B.
Mansouri, S.
Gaffiot, F.
author_facet Bourezig, Y.
Bouabdallah, B.
Mansouri, S.
Gaffiot, F.
author_sort Bourezig, Y.
title Modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors
title_short Modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors
title_full Modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors
title_fullStr Modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors
title_full_unstemmed Modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors
title_sort modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors
publisher Universiti Malaysia Perlis
publishDate 2009
url http://dspace.unimap.edu.my/xmlui/handle/123456789/5343
_version_ 1643788368055631872
score 13.214268