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Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications

Link to publisher's homepage at http://www.unimap.edu.my/ ; Open access only applicable for vol. 1; issue 1, 2008 & vol. 2; issue 1, 2009.

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Bibliographic Details
Main Authors: Salih, Kifah Q., Ahmed, N.M.
Format: Article
Language:English
Published: Universiti Malaysia Perlis 2009
Subjects:
Antireflection coatings
Silicon active medium
Transmissivity
Thin films
Silicon
Thin films > Optical properties
Porous silicon
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/5342
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spelling my.unimap-53422009-11-25T08:47:48Z Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications Salih, Kifah Q. Ahmed, N.M. Antireflection coatings Silicon active medium Transmissivity Thin films Silicon Thin films -- Optical properties Porous silicon Link to publisher's homepage at http://www.unimap.edu.my/ ; Open access only applicable for vol. 1; issue 1, 2008 & vol. 2; issue 1, 2009. A model, based on the Transfer Matrix Method (TMM) of multilayer is used to evaluate the transmittance at the central wavelength 720 nm of Si when using Ge, SiO2 nd Si as multilayer thin film coatings. In this study, the results indicate that the transmissivity of ~ (720-750) nm emission of Silicon as emitter is affected significantly by multilayer thin film coatings of Ge, SiO2 and Si. Si/SiO2/Air and Si?Ge/Si/SiO2/Air show high transmissivity 92% and ~100% at central wavelength design (720nm) respectively. Uncoated Si surface shows low transmissivity ~66%. The width of the high-transmittance region of Si/Ge/Si/SiO2/Air is less than Si/SiO2/Air. The origin of the red emission of Si has been investigated. 2009-04-07T02:41:47Z 2009-04-07T02:41:47Z 2009 Article International Journal of Nanoelectronics and Materials, vol. 2 (1), 2009, pages 109-118. 1985-5761 (Printed) 1997-4434 (Online) http://hdl.handle.net/123456789/5342 http://www.unimap.edu.my en Universiti Malaysia Perlis
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Antireflection coatings
Silicon active medium
Transmissivity
Thin films
Silicon
Thin films -- Optical properties
Porous silicon
spellingShingle Antireflection coatings
Silicon active medium
Transmissivity
Thin films
Silicon
Thin films -- Optical properties
Porous silicon
Salih, Kifah Q.
Ahmed, N.M.
Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications
description Link to publisher's homepage at http://www.unimap.edu.my/ ; Open access only applicable for vol. 1; issue 1, 2008 & vol. 2; issue 1, 2009.
format Article
author Salih, Kifah Q.
Ahmed, N.M.
author_facet Salih, Kifah Q.
Ahmed, N.M.
author_sort Salih, Kifah Q.
title Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications
title_short Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications
title_full Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications
title_fullStr Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications
title_full_unstemmed Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications
title_sort multilayer antireflection coatings model for red emission of silicon for optoelectronic applications
publisher Universiti Malaysia Perlis
publishDate 2009
url http://dspace.unimap.edu.my/xmlui/handle/123456789/5342
_version_ 1643788367748399104
score 13.214268

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