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Structural and optical properties of evaporated Ge/Al Bilayer thin films

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Main Authors: El-Nasser, H., Yakuphanoglu, F., Mahasneh, A., Ahmad, A.
Other Authors: hnasser@aabu.edu.jo.
Format: Article
Language:English
Published: Universiti Malaysia Perlis 2016
Subjects:
Optical properties
Spectroscopic ellipsometry
Ge/Al bilayer thin films
Online Access:http://dspace.unimap.edu.my:80/xmlui/handle/123456789/41238
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spelling my.unimap-412382017-11-21T03:35:54Z Structural and optical properties of evaporated Ge/Al Bilayer thin films El-Nasser, H. Yakuphanoglu, F. Mahasneh, A. Ahmad, A. hnasser@aabu.edu.jo. Optical properties Spectroscopic ellipsometry Ge/Al bilayer thin films Link to publisher's homepage at http://ijneam.unimap.edu.my/ Germanium- aluminium (a-Ge/Al) bilayer thin films with two different Al thickness were deposited onto glass substrates by thermal evaporation technique. The structural and optical properties were investigated and the effect of Al layer thickness on film properties was discussed. X-ray diffraction (XRD) confirmed the amorphous nature of the films under study. The small values of the roughness (7.04 nm, 7.2 nm) obtained from atomic force microscopy (AFM) measurements show relatively smooth surfaces. The optical properties of aGe-Al bilayer thin films were determined from the analysis of measured spectroscopy ellipsometry over the wavelength range 300-1000 nm at room temperature. The refractive index, extinction coefficient and thickness were obtained by the analysis of the ellipsometric spectra through Cauchy, and the Tauc-Lorenz models have been calculated. The optical energy gap was estimated from the absorption coefficient values which were estimated from the absorption coefficient values using Tauc's procedure. Our results show that the optical band gap decreases with increasing Al layer thickness. 2016-03-31T07:52:31Z 2016-03-31T07:52:31Z 2011 Article International Journal of Nanoelectronics and Materials, vol.4 (2), 2011, pages 135-144 1985-5761 (Printed) 1997-4434 (Online) http://ijneam.unimap.edu.my/ http://dspace.unimap.edu.my:80/xmlui/handle/123456789/41238 en Universiti Malaysia Perlis
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Optical properties
Spectroscopic ellipsometry
Ge/Al bilayer thin films
spellingShingle Optical properties
Spectroscopic ellipsometry
Ge/Al bilayer thin films
El-Nasser, H.
Yakuphanoglu, F.
Mahasneh, A.
Ahmad, A.
Structural and optical properties of evaporated Ge/Al Bilayer thin films
description Link to publisher's homepage at http://ijneam.unimap.edu.my/
author2 hnasser@aabu.edu.jo.
author_facet hnasser@aabu.edu.jo.
El-Nasser, H.
Yakuphanoglu, F.
Mahasneh, A.
Ahmad, A.
format Article
author El-Nasser, H.
Yakuphanoglu, F.
Mahasneh, A.
Ahmad, A.
author_sort El-Nasser, H.
title Structural and optical properties of evaporated Ge/Al Bilayer thin films
title_short Structural and optical properties of evaporated Ge/Al Bilayer thin films
title_full Structural and optical properties of evaporated Ge/Al Bilayer thin films
title_fullStr Structural and optical properties of evaporated Ge/Al Bilayer thin films
title_full_unstemmed Structural and optical properties of evaporated Ge/Al Bilayer thin films
title_sort structural and optical properties of evaporated ge/al bilayer thin films
publisher Universiti Malaysia Perlis
publishDate 2016
url http://dspace.unimap.edu.my:80/xmlui/handle/123456789/41238
_version_ 1643802787687956480
score 13.222552

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