Relationship between controllable process parameters on bump height in ENIG
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my.unimap-353352014-06-10T09:08:40Z Relationship between controllable process parameters on bump height in ENIG Zaliman, Sauli, Dr. Retnasamy, Vithyacharan Fairul Afzal, Ahmad Fuad Ehkan, Phaklen, Dr. Muhamad Hafiz, Ab Aziz zaliman@unimap.edu.my vc.sundress@gmail.com fairul@unimap.edu.my phaklen@unimap.edu.my muhamadhafiz@unimap.edu.my Bump height DOE ENIG Link to publisher's homepage at http://www.ttp.net/ This paper reports the factors that affect the bump height in electroless nickel immersion gold (ENIG) and their interrelation between each other. Bump height is a critical issue that needs to be investigated because a certain quality and requirements of bump height needs to be achieved prior to reflow oven soldering process. A total of four controllable process variables, with 16 sets of experiments were studied using a systematically designed design of experiment (DOE). The result suggests that the electroless nickel bath time has the most significant effect on the formation on bump height and consequently provide larger area for conductivity. 2014-06-10T09:08:40Z 2014-06-10T09:08:40Z 2013 Article Applied Mechanics and Materials, vol. 404, 2013, pages 62-66 978-303785845-5 1660-9336 http://www.scientific.net/AMM.404.62 http://dspace.unimap.edu.my:80/dspace/handle/123456789/35335 en Trans Tech Publications |
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Bump height DOE ENIG Zaliman, Sauli, Dr. Retnasamy, Vithyacharan Fairul Afzal, Ahmad Fuad Ehkan, Phaklen, Dr. Muhamad Hafiz, Ab Aziz Relationship between controllable process parameters on bump height in ENIG |
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zaliman@unimap.edu.my |
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zaliman@unimap.edu.my Zaliman, Sauli, Dr. Retnasamy, Vithyacharan Fairul Afzal, Ahmad Fuad Ehkan, Phaklen, Dr. Muhamad Hafiz, Ab Aziz |
format |
Article |
author |
Zaliman, Sauli, Dr. Retnasamy, Vithyacharan Fairul Afzal, Ahmad Fuad Ehkan, Phaklen, Dr. Muhamad Hafiz, Ab Aziz |
author_sort |
Zaliman, Sauli, Dr. |
title |
Relationship between controllable process parameters on bump height in ENIG |
title_short |
Relationship between controllable process parameters on bump height in ENIG |
title_full |
Relationship between controllable process parameters on bump height in ENIG |
title_fullStr |
Relationship between controllable process parameters on bump height in ENIG |
title_full_unstemmed |
Relationship between controllable process parameters on bump height in ENIG |
title_sort |
relationship between controllable process parameters on bump height in enig |
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Trans Tech Publications |
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2014 |
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http://dspace.unimap.edu.my:80/dspace/handle/123456789/35335 |
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1643797771075977216 |
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13.18916 |