Fabrication and characterization of silicon-based Ba0.7Sr 0.3TiO3 thin films for FeFET applications

• Main Authors: Saif, Ala'eddin A., Poopalan, Prabakaran, Dr.
• Other Authors: [e-mail]
• Format: Working Paper
• Language: English
• Published: Institute of Electrical and Electronics Engineers (IEEE) 2014
• Subjects: BST thin film; Ferroelectric hysteresis; Grain size; Memory windows
• Online Access: http://dspace.unimap.edu.my:80/dspace/handle/123456789/32140

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