An effective simulation analysis of transient electromagnetic multiple faults

• Main Authors: Liang Dong, Hongxin Zhang, Shaofei Sun, Lei Zhu, Xiaotong Cui, Bablu Kumar Ghosh
• Format: Article
• Language: English
• Published: 2020
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: https://eprints.ums.edu.my/id/eprint/25518/1/An%20effective%20simulation%20analysis%20of%20transient%20electromagnetic%20multiple%20faults.pdf; https://eprints.ums.edu.my/id/eprint/25518/; https://doi.org/10.3390/s20071976

Embedded encryption devices and smart sensors are vulnerable to physical attacks. Due to the continuous shrinking of chip size, laser injection, particle radiation and electromagnetic transient injection are possible methods that introduce transient multiple faults. In the fault analysis stage, the...