Evaluation of the Transfer Learning Models in Wafer Defects Classification

• Main Authors: Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund, Lim, Shi Xuen
• Format: Conference or Workshop Item
• Language: English
• Published: Springer Nature 2022
• Subjects: TJ Mechanical engineering and machinery
• Online Access: http://umpir.ump.edu.my/id/eprint/36763/1/Evaluation%20of%20the%20Transfer%20Learning%20Models%20in%20Wafer%20Defects%20Classification%20%281%29.pdf; http://umpir.ump.edu.my/id/eprint/36763/; https://doi.org/10.1007/978-981-33-4597-3_78

In a semiconductor industry, wafer defect detection has becoming ubiquitous. Various machine learning algorithms had been adopted to be the “brain” behind the machine for reliable, fast defect detection. Transfer Learning is one of the common methods. Various algorithms under Transfer Learning had b...