A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device

Dielectrophoresis (DEP) has been proven as a method of manipulating and analyzing the electrophysiological properties of bioparticles by applying non-uniform electric fields generated through special electrodes. Various electrode geometries have been developed to address different applications. Simu...

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Main Authors: Yafouz, Bashar, Kadri, Nahrizul Adib, Ibrahim, Fatimah
Format: Conference or Workshop Item
Language:English
Published: 2012
Subjects:
Online Access:http://eprints.um.edu.my/9336/1/A_numerical_analysis_of_electric_field_strength_over_planar_microarray_dot_electrode_for_dielectrophoretic_lab-on-chip_device.pdf
http://eprints.um.edu.my/9336/
http://www.scopus.com/inward/record.url?eid=2-s2.0-84876760723&partnerID=40&md5=4c8507fb654851173a8d7c6a913d3994 http://ieeexplore.ieee.org/xpls/absall.jsp?arnumber=6498060
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spelling my.um.eprints.93362021-01-20T08:10:53Z http://eprints.um.edu.my/9336/ A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device Yafouz, Bashar Kadri, Nahrizul Adib Ibrahim, Fatimah T Technology (General) TA Engineering (General). Civil engineering (General) Dielectrophoresis (DEP) has been proven as a method of manipulating and analyzing the electrophysiological properties of bioparticles by applying non-uniform electric fields generated through special electrodes. Various electrode geometries have been developed to address different applications. Simulation of the electric field strength over electrodes is essential in order to optimize the generated DEP force for enhancing cell manipulation. This paper describes the study of electric field distribution over planar multiple microarray dot electrode using numerical modeling of Comsol Multiphysics 4.2a®. Results show that the electric field strength is axisymmetrical around the centre of the dot aperture and that is higher at the dot edges than the dot centers. Further studies will be conducted to investigate the effect of applying different frequencies, varying dots size and adding ground plane in between the electrode dots. © 2012 IEEE. 2012 Conference or Workshop Item PeerReviewed application/pdf en http://eprints.um.edu.my/9336/1/A_numerical_analysis_of_electric_field_strength_over_planar_microarray_dot_electrode_for_dielectrophoretic_lab-on-chip_device.pdf Yafouz, Bashar and Kadri, Nahrizul Adib and Ibrahim, Fatimah (2012) A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device. In: 2012 2nd IEEE-EMBS Conference on Biomedical Engineering and Sciences, IECBES 2012, 2012, Langkawi. http://www.scopus.com/inward/record.url?eid=2-s2.0-84876760723&partnerID=40&md5=4c8507fb654851173a8d7c6a913d3994 http://ieeexplore.ieee.org/xpls/absall.jsp?arnumber=6498060
institution Universiti Malaya
building UM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaya
content_source UM Research Repository
url_provider http://eprints.um.edu.my/
language English
topic T Technology (General)
TA Engineering (General). Civil engineering (General)
spellingShingle T Technology (General)
TA Engineering (General). Civil engineering (General)
Yafouz, Bashar
Kadri, Nahrizul Adib
Ibrahim, Fatimah
A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device
description Dielectrophoresis (DEP) has been proven as a method of manipulating and analyzing the electrophysiological properties of bioparticles by applying non-uniform electric fields generated through special electrodes. Various electrode geometries have been developed to address different applications. Simulation of the electric field strength over electrodes is essential in order to optimize the generated DEP force for enhancing cell manipulation. This paper describes the study of electric field distribution over planar multiple microarray dot electrode using numerical modeling of Comsol Multiphysics 4.2a®. Results show that the electric field strength is axisymmetrical around the centre of the dot aperture and that is higher at the dot edges than the dot centers. Further studies will be conducted to investigate the effect of applying different frequencies, varying dots size and adding ground plane in between the electrode dots. © 2012 IEEE.
format Conference or Workshop Item
author Yafouz, Bashar
Kadri, Nahrizul Adib
Ibrahim, Fatimah
author_facet Yafouz, Bashar
Kadri, Nahrizul Adib
Ibrahim, Fatimah
author_sort Yafouz, Bashar
title A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device
title_short A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device
title_full A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device
title_fullStr A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device
title_full_unstemmed A numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device
title_sort numerical analysis of electric field strength over planar microarray dot electrode for dielectrophoretic lab-on-chip device
publishDate 2012
url http://eprints.um.edu.my/9336/1/A_numerical_analysis_of_electric_field_strength_over_planar_microarray_dot_electrode_for_dielectrophoretic_lab-on-chip_device.pdf
http://eprints.um.edu.my/9336/
http://www.scopus.com/inward/record.url?eid=2-s2.0-84876760723&partnerID=40&md5=4c8507fb654851173a8d7c6a913d3994 http://ieeexplore.ieee.org/xpls/absall.jsp?arnumber=6498060
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score 13.18916