An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials
Semiconductor materials play a crucial role in the development of optoelectronics and power devices. However, their evaluation and selection pose a multi-attribute decision-making problem. This problem encompasses various considerations, such as multiple evaluation criteria, data variation, and the...
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my.um.eprints.443192024-07-05T07:26:06Z http://eprints.um.edu.my/44319/ An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials Al-Samarraay, Mohammed Al-Zuhairi, Omar Alamoodi, A. H. Albahri, O. S. Deveci, Muhammet Alobaidi, O. R. Albahri, A. S. Kou, Gang TK Electrical engineering. Electronics Nuclear engineering Semiconductor materials play a crucial role in the development of optoelectronics and power devices. However, their evaluation and selection pose a multi-attribute decision-making problem. This problem encompasses various considerations, such as multiple evaluation criteria, data variation, and the importance of criteria multiplicity. Therefore, this study proposes an integrated fuzzy multi-measurement decision-making model (IFMMDMM) to evaluate and select optimization techniques for semi-polar III-V semiconductor materials. The research methodology is designed based on three sequential phases. Firstly, four optimization techniques for semi-polar III-V semiconductor materials and four evaluation criteria are identified to construct the evaluation decision matrix. Secondly, the fuzzy-weighted zero-inconsistency method is developed to evaluate and assign weights to the defined multi-measurement criteria. Thirdly, the fuzzy decision by opinion score method is developed to select the optimization techniques for semi-polar III-V semiconductor materials. The weighting results reveal that the highest weight value was assigned to `root mean square under surface morphology' (0.1382), while `peak-to-valley under surface morphology' received the lowest weight value (0.1074). The selection results indicated that `different flux with fixed cycle NH3 treatment (D)' ranked first, whereas `NH3 flux at changing V/III (A)' had the lowest performance order. Systematic and sensitivity ranking assessments were performed to verify the efficiency of the proposed model. PERGAMON-ELSEVIER SCIENCE LTD 2024-03-01 Article PeerReviewed Al-Samarraay, Mohammed and Al-Zuhairi, Omar and Alamoodi, A. H. and Albahri, O. S. and Deveci, Muhammet and Alobaidi, O. R. and Albahri, A. S. and Kou, Gang (2024) An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials. Expert Systems with Applications, 237 (B). ISSN 1873-6793, DOI https://doi.org/10.1016/j.eswa.2023.121439 <https://doi.org/10.1016/j.eswa.2023.121439>. https://doi.org/10.1016/j.eswa.2023.121439 10.1016/j.eswa.2023.121439 |
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TK Electrical engineering. Electronics Nuclear engineering Al-Samarraay, Mohammed Al-Zuhairi, Omar Alamoodi, A. H. Albahri, O. S. Deveci, Muhammet Alobaidi, O. R. Albahri, A. S. Kou, Gang An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials |
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Semiconductor materials play a crucial role in the development of optoelectronics and power devices. However, their evaluation and selection pose a multi-attribute decision-making problem. This problem encompasses various considerations, such as multiple evaluation criteria, data variation, and the importance of criteria multiplicity. Therefore, this study proposes an integrated fuzzy multi-measurement decision-making model (IFMMDMM) to evaluate and select optimization techniques for semi-polar III-V semiconductor materials. The research methodology is designed based on three sequential phases. Firstly, four optimization techniques for semi-polar III-V semiconductor materials and four evaluation criteria are identified to construct the evaluation decision matrix. Secondly, the fuzzy-weighted zero-inconsistency method is developed to evaluate and assign weights to the defined multi-measurement criteria. Thirdly, the fuzzy decision by opinion score method is developed to select the optimization techniques for semi-polar III-V semiconductor materials. The weighting results reveal that the highest weight value was assigned to `root mean square under surface morphology' (0.1382), while `peak-to-valley under surface morphology' received the lowest weight value (0.1074). The selection results indicated that `different flux with fixed cycle NH3 treatment (D)' ranked first, whereas `NH3 flux at changing V/III (A)' had the lowest performance order. Systematic and sensitivity ranking assessments were performed to verify the efficiency of the proposed model. |
format |
Article |
author |
Al-Samarraay, Mohammed Al-Zuhairi, Omar Alamoodi, A. H. Albahri, O. S. Deveci, Muhammet Alobaidi, O. R. Albahri, A. S. Kou, Gang |
author_facet |
Al-Samarraay, Mohammed Al-Zuhairi, Omar Alamoodi, A. H. Albahri, O. S. Deveci, Muhammet Alobaidi, O. R. Albahri, A. S. Kou, Gang |
author_sort |
Al-Samarraay, Mohammed |
title |
An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials |
title_short |
An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials |
title_full |
An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials |
title_fullStr |
An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials |
title_full_unstemmed |
An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials |
title_sort |
integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials |
publisher |
PERGAMON-ELSEVIER SCIENCE LTD |
publishDate |
2024 |
url |
http://eprints.um.edu.my/44319/ https://doi.org/10.1016/j.eswa.2023.121439 |
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1805881158191284224 |
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13.211869 |