An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials

Semiconductor materials play a crucial role in the development of optoelectronics and power devices. However, their evaluation and selection pose a multi-attribute decision-making problem. This problem encompasses various considerations, such as multiple evaluation criteria, data variation, and the...

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Main Authors: Al-Samarraay, Mohammed, Al-Zuhairi, Omar, Alamoodi, A. H., Albahri, O. S., Deveci, Muhammet, Alobaidi, O. R., Albahri, A. S., Kou, Gang
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Published: PERGAMON-ELSEVIER SCIENCE LTD 2024
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Online Access:http://eprints.um.edu.my/44319/
https://doi.org/10.1016/j.eswa.2023.121439
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spelling my.um.eprints.443192024-07-05T07:26:06Z http://eprints.um.edu.my/44319/ An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials Al-Samarraay, Mohammed Al-Zuhairi, Omar Alamoodi, A. H. Albahri, O. S. Deveci, Muhammet Alobaidi, O. R. Albahri, A. S. Kou, Gang TK Electrical engineering. Electronics Nuclear engineering Semiconductor materials play a crucial role in the development of optoelectronics and power devices. However, their evaluation and selection pose a multi-attribute decision-making problem. This problem encompasses various considerations, such as multiple evaluation criteria, data variation, and the importance of criteria multiplicity. Therefore, this study proposes an integrated fuzzy multi-measurement decision-making model (IFMMDMM) to evaluate and select optimization techniques for semi-polar III-V semiconductor materials. The research methodology is designed based on three sequential phases. Firstly, four optimization techniques for semi-polar III-V semiconductor materials and four evaluation criteria are identified to construct the evaluation decision matrix. Secondly, the fuzzy-weighted zero-inconsistency method is developed to evaluate and assign weights to the defined multi-measurement criteria. Thirdly, the fuzzy decision by opinion score method is developed to select the optimization techniques for semi-polar III-V semiconductor materials. The weighting results reveal that the highest weight value was assigned to `root mean square under surface morphology' (0.1382), while `peak-to-valley under surface morphology' received the lowest weight value (0.1074). The selection results indicated that `different flux with fixed cycle NH3 treatment (D)' ranked first, whereas `NH3 flux at changing V/III (A)' had the lowest performance order. Systematic and sensitivity ranking assessments were performed to verify the efficiency of the proposed model. PERGAMON-ELSEVIER SCIENCE LTD 2024-03-01 Article PeerReviewed Al-Samarraay, Mohammed and Al-Zuhairi, Omar and Alamoodi, A. H. and Albahri, O. S. and Deveci, Muhammet and Alobaidi, O. R. and Albahri, A. S. and Kou, Gang (2024) An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials. Expert Systems with Applications, 237 (B). ISSN 1873-6793, DOI https://doi.org/10.1016/j.eswa.2023.121439 <https://doi.org/10.1016/j.eswa.2023.121439>. https://doi.org/10.1016/j.eswa.2023.121439 10.1016/j.eswa.2023.121439
institution Universiti Malaya
building UM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaya
content_source UM Research Repository
url_provider http://eprints.um.edu.my/
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Al-Samarraay, Mohammed
Al-Zuhairi, Omar
Alamoodi, A. H.
Albahri, O. S.
Deveci, Muhammet
Alobaidi, O. R.
Albahri, A. S.
Kou, Gang
An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials
description Semiconductor materials play a crucial role in the development of optoelectronics and power devices. However, their evaluation and selection pose a multi-attribute decision-making problem. This problem encompasses various considerations, such as multiple evaluation criteria, data variation, and the importance of criteria multiplicity. Therefore, this study proposes an integrated fuzzy multi-measurement decision-making model (IFMMDMM) to evaluate and select optimization techniques for semi-polar III-V semiconductor materials. The research methodology is designed based on three sequential phases. Firstly, four optimization techniques for semi-polar III-V semiconductor materials and four evaluation criteria are identified to construct the evaluation decision matrix. Secondly, the fuzzy-weighted zero-inconsistency method is developed to evaluate and assign weights to the defined multi-measurement criteria. Thirdly, the fuzzy decision by opinion score method is developed to select the optimization techniques for semi-polar III-V semiconductor materials. The weighting results reveal that the highest weight value was assigned to `root mean square under surface morphology' (0.1382), while `peak-to-valley under surface morphology' received the lowest weight value (0.1074). The selection results indicated that `different flux with fixed cycle NH3 treatment (D)' ranked first, whereas `NH3 flux at changing V/III (A)' had the lowest performance order. Systematic and sensitivity ranking assessments were performed to verify the efficiency of the proposed model.
format Article
author Al-Samarraay, Mohammed
Al-Zuhairi, Omar
Alamoodi, A. H.
Albahri, O. S.
Deveci, Muhammet
Alobaidi, O. R.
Albahri, A. S.
Kou, Gang
author_facet Al-Samarraay, Mohammed
Al-Zuhairi, Omar
Alamoodi, A. H.
Albahri, O. S.
Deveci, Muhammet
Alobaidi, O. R.
Albahri, A. S.
Kou, Gang
author_sort Al-Samarraay, Mohammed
title An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials
title_short An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials
title_full An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials
title_fullStr An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials
title_full_unstemmed An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials
title_sort integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials
publisher PERGAMON-ELSEVIER SCIENCE LTD
publishDate 2024
url http://eprints.um.edu.my/44319/
https://doi.org/10.1016/j.eswa.2023.121439
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score 13.188404