Parameter extraction and selection for a scalable N-type SiC MOSFETs model and characteristic verification along with conventional dc-dc buck converter integration
Most silicon carbide (SiC) MOSFET models are application-specific. These are already defined by the manufacturers and their parameters are mostly partially accessible due to restrictions. The desired characteristic of any SiC model becomes highly important if an individual wants to visualize the imp...
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my.um.eprints.388242023-11-30T08:28:13Z http://eprints.um.edu.my/38824/ Parameter extraction and selection for a scalable N-type SiC MOSFETs model and characteristic verification along with conventional dc-dc buck converter integration Khalid, Hassan Mekhilef, Saad Siddique, Marif Daula Wahyudie, Addy Ahmed, Mahrous Seyedmahmoudian, Mehdi Stojcevski, Alex TK Electrical engineering. Electronics Nuclear engineering Most silicon carbide (SiC) MOSFET models are application-specific. These are already defined by the manufacturers and their parameters are mostly partially accessible due to restrictions. The desired characteristic of any SiC model becomes highly important if an individual wants to visualize the impact of changing intrinsic parameters as well. Also, it requires a model prior knowledge to vary these parameters accordingly. This paper proposes the parameter extraction and its selection for Silicon Carbide (SiC) power N-MOSFET model in a unique way. The extracted parameters are verified through practical implementation with a small-scale high power DC-DC 5 to 2.5 output voltage buck converter using both hardware and software emphasis. The parameters extracted using the proposed method are also tested to verify the static and dynamic characteristics of SiC MOSFET. These parameters include intrinsic, junction and overlapping capacitance. The parameters thus extracted for the SiC MOSFET are analyzed by device performance. This includes input, output transfer characteristics and transient delays under different temperature conditions and loading capabilities. The simulation and experimental results show that the parameters are highly accurate. With its development, researchers will be able to simulate and test any change in intrinsic parameters along with circuit emphasis. Public Library of Science 2023-01-13 Article PeerReviewed Khalid, Hassan and Mekhilef, Saad and Siddique, Marif Daula and Wahyudie, Addy and Ahmed, Mahrous and Seyedmahmoudian, Mehdi and Stojcevski, Alex (2023) Parameter extraction and selection for a scalable N-type SiC MOSFETs model and characteristic verification along with conventional dc-dc buck converter integration. PLoS ONE, 18 (1). ISSN 1932-6203, DOI https://doi.org/10.1371/journal.pone.0277331 <https://doi.org/10.1371/journal.pone.0277331>. 10.1371/journal.pone.0277331 |
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TK Electrical engineering. Electronics Nuclear engineering Khalid, Hassan Mekhilef, Saad Siddique, Marif Daula Wahyudie, Addy Ahmed, Mahrous Seyedmahmoudian, Mehdi Stojcevski, Alex Parameter extraction and selection for a scalable N-type SiC MOSFETs model and characteristic verification along with conventional dc-dc buck converter integration |
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Most silicon carbide (SiC) MOSFET models are application-specific. These are already defined by the manufacturers and their parameters are mostly partially accessible due to restrictions. The desired characteristic of any SiC model becomes highly important if an individual wants to visualize the impact of changing intrinsic parameters as well. Also, it requires a model prior knowledge to vary these parameters accordingly. This paper proposes the parameter extraction and its selection for Silicon Carbide (SiC) power N-MOSFET model in a unique way. The extracted parameters are verified through practical implementation with a small-scale high power DC-DC 5 to 2.5 output voltage buck converter using both hardware and software emphasis. The parameters extracted using the proposed method are also tested to verify the static and dynamic characteristics of SiC MOSFET. These parameters include intrinsic, junction and overlapping capacitance. The parameters thus extracted for the SiC MOSFET are analyzed by device performance. This includes input, output transfer characteristics and transient delays under different temperature conditions and loading capabilities. The simulation and experimental results show that the parameters are highly accurate. With its development, researchers will be able to simulate and test any change in intrinsic parameters along with circuit emphasis. |
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Article |
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Khalid, Hassan Mekhilef, Saad Siddique, Marif Daula Wahyudie, Addy Ahmed, Mahrous Seyedmahmoudian, Mehdi Stojcevski, Alex |
author_facet |
Khalid, Hassan Mekhilef, Saad Siddique, Marif Daula Wahyudie, Addy Ahmed, Mahrous Seyedmahmoudian, Mehdi Stojcevski, Alex |
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Khalid, Hassan |
title |
Parameter extraction and selection for a scalable N-type SiC MOSFETs model and characteristic verification along with conventional dc-dc buck converter integration |
title_short |
Parameter extraction and selection for a scalable N-type SiC MOSFETs model and characteristic verification along with conventional dc-dc buck converter integration |
title_full |
Parameter extraction and selection for a scalable N-type SiC MOSFETs model and characteristic verification along with conventional dc-dc buck converter integration |
title_fullStr |
Parameter extraction and selection for a scalable N-type SiC MOSFETs model and characteristic verification along with conventional dc-dc buck converter integration |
title_full_unstemmed |
Parameter extraction and selection for a scalable N-type SiC MOSFETs model and characteristic verification along with conventional dc-dc buck converter integration |
title_sort |
parameter extraction and selection for a scalable n-type sic mosfets model and characteristic verification along with conventional dc-dc buck converter integration |
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Public Library of Science |
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2023 |
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http://eprints.um.edu.my/38824/ |
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