Polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films

The polarization response of graphene oxide (GO)-coated planarized optical waveguides is used to determine the complex refractive index of GO film. GO films with thicknesses between 0.10 and 0.71 mu m were coated on planarized optical waveguides. GO-coated waveguides exhibit large polarization depen...

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Main Authors: Gan, SoonXin, Chong, WenSin, Lai, ChoonKong, Chong, WuYi, Madden, Stephen J., Choi, Duk-Yong, De La Rue, Richard M., Ahmad, Harith
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Published: Optical Society of America 2022
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Online Access:http://eprints.um.edu.my/33471/
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spelling my.um.eprints.334712022-08-01T03:00:00Z http://eprints.um.edu.my/33471/ Polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films Gan, SoonXin Chong, WenSin Lai, ChoonKong Chong, WuYi Madden, Stephen J. Choi, Duk-Yong De La Rue, Richard M. Ahmad, Harith RE Ophthalmology The polarization response of graphene oxide (GO)-coated planarized optical waveguides is used to determine the complex refractive index of GO film. GO films with thicknesses between 0.10 and 0.71 mu m were coated on planarized optical waveguides. GO-coated waveguides exhibit large polarization dependent losses-and the polarization response depends strongly on the GO coating thickness. The response was used, together with finite element analysis, to determine the complex refractive index of the GO film. The complex refractive indices of GO films for both TE- and TM-polarized light at a wavelength of 1550 nm were found to be 1.71 + 0.09i and 1.58 + 0.05i, respectively. The uncertainties of n(GO) and k(GO) for TE-polarized light are +/- 0.02 and +/- 0.03, respectively, whereas the uncertainties of n(GO) and k(GO) for TM-polarized light are +/- 0.05 and +/- 0.02, respectively. (C) 2022 Optical Society of America Optical Society of America 2022-01-20 Article PeerReviewed Gan, SoonXin and Chong, WenSin and Lai, ChoonKong and Chong, WuYi and Madden, Stephen J. and Choi, Duk-Yong and De La Rue, Richard M. and Ahmad, Harith (2022) Polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films. Applied Optics, 61 (3). pp. 744-750. ISSN 1559-128X, DOI https://doi.org/10.1364/AO.435309 <https://doi.org/10.1364/AO.435309>. 10.1364/AO.435309
institution Universiti Malaya
building UM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaya
content_source UM Research Repository
url_provider http://eprints.um.edu.my/
topic RE Ophthalmology
spellingShingle RE Ophthalmology
Gan, SoonXin
Chong, WenSin
Lai, ChoonKong
Chong, WuYi
Madden, Stephen J.
Choi, Duk-Yong
De La Rue, Richard M.
Ahmad, Harith
Polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films
description The polarization response of graphene oxide (GO)-coated planarized optical waveguides is used to determine the complex refractive index of GO film. GO films with thicknesses between 0.10 and 0.71 mu m were coated on planarized optical waveguides. GO-coated waveguides exhibit large polarization dependent losses-and the polarization response depends strongly on the GO coating thickness. The response was used, together with finite element analysis, to determine the complex refractive index of the GO film. The complex refractive indices of GO films for both TE- and TM-polarized light at a wavelength of 1550 nm were found to be 1.71 + 0.09i and 1.58 + 0.05i, respectively. The uncertainties of n(GO) and k(GO) for TE-polarized light are +/- 0.02 and +/- 0.03, respectively, whereas the uncertainties of n(GO) and k(GO) for TM-polarized light are +/- 0.05 and +/- 0.02, respectively. (C) 2022 Optical Society of America
format Article
author Gan, SoonXin
Chong, WenSin
Lai, ChoonKong
Chong, WuYi
Madden, Stephen J.
Choi, Duk-Yong
De La Rue, Richard M.
Ahmad, Harith
author_facet Gan, SoonXin
Chong, WenSin
Lai, ChoonKong
Chong, WuYi
Madden, Stephen J.
Choi, Duk-Yong
De La Rue, Richard M.
Ahmad, Harith
author_sort Gan, SoonXin
title Polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films
title_short Polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films
title_full Polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films
title_fullStr Polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films
title_full_unstemmed Polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films
title_sort polarization response of planarized optical waveguides to determine the anisotropic complex refractive index of graphene oxide thin films
publisher Optical Society of America
publishDate 2022
url http://eprints.um.edu.my/33471/
_version_ 1740826033359159296
score 13.159267