Critical Properties for Binary Mixtures of Ethane Containing Low Concentrations of n-Alkane
The critical temperature and pressure for binary mixtures of ethane containing n-alkanes (C5 to C10) at low concentrations (up to 5.2 mol %) have been determined. A visual technique was used where the observation of mixture critical opalescence followed by the appearance of a vapor−liquid meniscus i...
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2000
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my.um.eprints.260082021-09-01T05:14:06Z http://eprints.um.edu.my/26008/ Critical Properties for Binary Mixtures of Ethane Containing Low Concentrations of n-Alkane Singh, Harcharan Lucien, Frank P. Foster, Neil R. TP Chemical technology The critical temperature and pressure for binary mixtures of ethane containing n-alkanes (C5 to C10) at low concentrations (up to 5.2 mol %) have been determined. A visual technique was used where the observation of mixture critical opalescence followed by the appearance of a vapor−liquid meniscus in a constant volume sight gauge was observed. The absolute errors in the measurements of the mixture critical temperature and pressure were ±2 K and ±0.5 bar, respectively, with an estimated relative error of ±1.5% for the composition of the organic compounds used. The binary mixture critical temperature and pressure were estimated using a correlation based on the theory of conformal solutions and a dilute-mixture Soave−Redlich−Kwong (SRK) equation of state approach. Both methods correlated the critical mixture temperature to an absolute error of within 3 K. However, the mixture critical pressure was correlated to an absolute error of within 10 and 4 bar using the conformal solutions correlation and a dilute-mixture SRK equation of state, respectively. American Chemical Society 2000 Article PeerReviewed Singh, Harcharan and Lucien, Frank P. and Foster, Neil R. (2000) Critical Properties for Binary Mixtures of Ethane Containing Low Concentrations of n-Alkane. Journal of Chemical & Engineering Data, 45 (1). pp. 131-135. ISSN 0021-9568 https://doi.org/10.1021/je990220w doi:10.1021/je990220w |
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TP Chemical technology Singh, Harcharan Lucien, Frank P. Foster, Neil R. Critical Properties for Binary Mixtures of Ethane Containing Low Concentrations of n-Alkane |
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The critical temperature and pressure for binary mixtures of ethane containing n-alkanes (C5 to C10) at low concentrations (up to 5.2 mol %) have been determined. A visual technique was used where the observation of mixture critical opalescence followed by the appearance of a vapor−liquid meniscus in a constant volume sight gauge was observed. The absolute errors in the measurements of the mixture critical temperature and pressure were ±2 K and ±0.5 bar, respectively, with an estimated relative error of ±1.5% for the composition of the organic compounds used. The binary mixture critical temperature and pressure were estimated using a correlation based on the theory of conformal solutions and a dilute-mixture Soave−Redlich−Kwong (SRK) equation of state approach. Both methods correlated the critical mixture temperature to an absolute error of within 3 K. However, the mixture critical pressure was correlated to an absolute error of within 10 and 4 bar using the conformal solutions correlation and a dilute-mixture SRK equation of state, respectively. |
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Article |
author |
Singh, Harcharan Lucien, Frank P. Foster, Neil R. |
author_facet |
Singh, Harcharan Lucien, Frank P. Foster, Neil R. |
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Singh, Harcharan |
title |
Critical Properties for Binary Mixtures of Ethane Containing Low Concentrations of n-Alkane |
title_short |
Critical Properties for Binary Mixtures of Ethane Containing Low Concentrations of n-Alkane |
title_full |
Critical Properties for Binary Mixtures of Ethane Containing Low Concentrations of n-Alkane |
title_fullStr |
Critical Properties for Binary Mixtures of Ethane Containing Low Concentrations of n-Alkane |
title_full_unstemmed |
Critical Properties for Binary Mixtures of Ethane Containing Low Concentrations of n-Alkane |
title_sort |
critical properties for binary mixtures of ethane containing low concentrations of n-alkane |
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American Chemical Society |
publishDate |
2000 |
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http://eprints.um.edu.my/26008/ https://doi.org/10.1021/je990220w |
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1710675849626255360 |
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13.214268 |