Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films

Purpose: This paper aims to determine the crystallite size and microstrain values of AgSiN thin films using potential approach called approximation method. This method can be used as a replacement for other determination methods such as Williamson-Hall (W-H) plot and Warren-Averbach analysis. Design...

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Bibliographic Details
Main Authors: Mohamad Zaidi, Umi Zalilah, Bushroa, Abdul Razak, Ghahnavyeh, Reza Rahbari, Mahmoodian, Reza
Format: Article
Published: Emerald 2019
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Online Access:http://eprints.um.edu.my/24010/
https://doi.org/10.1108/PRT-03-2018-0026
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